He received the B.S. degree in electronic information and science technology from the Tangshan Normal University, Tangshan, China, now studying in electronics and communication engineering from the information security from the Civil Aviation University of China for M.S. degree. His main interests include steganography and steganalysis based on AMR.
Research Keywords & Expertise
AMR
Data Analysis
Information Security
Steganography
steganalysis
deep leaning
Short Biography
He received the B.S. degree in electronic information and science technology from the Tangshan Normal University, Tangshan, China, now studying in electronics and communication engineering from the information security from the Civil Aviation University of China for M.S. degree. His main interests include steganography and steganalysis based on AMR.