Solar photovoltaic (PV) energy has shown significant expansion on the installed capacity over the last years. Most of its power systems are installed on rooftops, integrated into buildings. Considering the fast development of PV plants, it has becoming even more critical to understand the performance and reliability of such systems. One of the most common problems faced in PV plants occurs when solar cells receive non-uniform irradiance or partially shaded. The consequences of shading generally are prevented by bypass diodes. A significant number of studies and technical reports have been published as of today, based on extensive experience from research and field feedbacks. However, such material has not been cataloged or analyzed from a perspective of the technological evolution of bypass diodes devices. This paper presents a comprehensive review and highlights recent advances, ongoing research, and prospects, as reported in the literature, on bypass diode application on photovoltaic modules. First, it outlines the shading effect and hotspot problem on PV modules. Following, it explains bypass diodes’ working principle, as well as discusses how such devices can impact power output and PV modules’ reliability. Then, it gives a thorough review of recently published research, as well as the state of the art in the field. In conclusion, it makes a discussion on the overview and challenges to bypass diode as a mitigation technique.

Classic and intelligent techniques aim to locate and track the maximum power point of photovoltaic (PV) systems, such as perturb and observe (P&O), fuzzy logic (FL), artificial neural networks (ANNs), and adaptive neuro-fuzzy inference systems (ANFISs). This paper proposes and compares three intelligent algorithms for maximum power point tracking (MPPT) control, specifically fuzzy, ANN, and ANFIS. The modeling of a single-diode equivalent circuit-based 3 kWp PV plant was developed and validated to achieve this purpose. Then, the MPPT techniques were designed and applied to control the buck–boost converter’s switching device of the PV plant. All three methods use the ambient conditions as input variables: solar irradiance and ambient temperature. The proposed methodology comprises the study of the dynamic response for tracking the maximum power point and the power generated of the PV systems, and it was compared to the classic P&O technique under varying ambient conditions. We observed that the intelligent techniques outperformed the classic P&O method in tracking speed, tracking accuracy, and reducing oscillation around the maximum power point (MPP). The ANN technique was the better control algorithm in energy gain, managing to recover up to 9.9% power.

This work introduces a new fault detection method for photovoltaic systems. The method identifies short-circuited modules and disconnected strings on photovoltaic systems combining two machine learning techniques. The first algorithm is a multilayer feedforward neural network, which uses irradiance, ambient temperature, and power at the maximum power point as input variables. The neural network output enters a Sugeno type fuzzy logic system that precisely determines how many faulty modules are occurring on the power plant. The proposed method was trained using a simulated dataset and validated using experimental data. The obtained results showed 99.28% accuracy on detecting short-circuited photovoltaic modules and 99.43% on detecting disconnected strings.

Potential-induced degradation (PID) of photovoltaic (PV) cells is one of the most severe types of degradation, where the output power losses in solar cells may even exceed 30%. In this article, we present the development of a suitable anti-reflection coating (ARC) structure of solar cells to mitigate the PID effect using a SiO₂ ARC layer. Our PID testing experiments show that the proposed ARC layer can improve the durability and reliability of the solar cell, where the maximum drop in efficiency was equal to 0.69% after 96 h of PID testing using an applied voltage of 1000 V and temperature setting at 85 °C. In addition, we observed that the maximum losses in the current density are equal to 0.8 mA/cm², compared with 4.5 mA/cm² current density loss without using the SiO₂ ARC layer.