Byoungho Kim received B.S. and M.S. degrees in electronic engineering from Hanyang University, Korea, in 1998 and 2000, respectively, and a Ph.D. degree in electrical and computer engineering from the University of Texas at Austin, in 2007. Since 2006, he was been working with the Texas Instruments Corp., Santa Clara, CA, as a Staff Engineer. From 2010 to 2015, he worked with the Broadcom Corp., Irvine, CA, as a Principal Scientist. Since March of 2015, he has been employed in the Division of Electrical Engineering at Hanyang University, Ansan, Korea, where he is a Professor. His research interests include the design and testing of analog and mixed-signal circuits and high-speed I/Os. He is the recipient of the 2007 IEEE VLSI Test Symposium (VTS) best paper award, and is the recipient of the 2011 best reviewer award of the IEEE Transactions on Instrumentation and Measurement (TIM) and the Instrumentation and Measurement Society (IMS). He is an IEEE senior member.