A nanostructured thin film of NiO with thickness (1250 ± 30) nm was synthesized using the RF-reactive planer magnetron sputtering technique over a cleaned glass substrate. Structural analysis of the nanostructured NiO films was conducted utilising the XRD method, and the films were found to have a polycrystalline nature with a preferred (200) plane reflection at the angle 2θ equal to 43.35ᵒ. The optical measurement for NiO thin films manifested the transmittance, the energy band gap and the absorption coefficient in the ultraviolet and visible regions. A scanning electron microscope (SEM) was used to analyses the surface morphology of the NiO thin film sample. The ability of nanostructured NiO thin films to sense different NO₂ gas concentrations in terms of the time working was studied and reported. The nanostructured NiO film had better sensitivity at the gas ratio of 350 ppm and the operating temperature 150ᵒC.

The ceramic techniques were used to prepare spinal ferrite (Mg‐Zn) to evaluate and investigate the microwaves absorption at X‐band and Ku‐band with formula (Mg_{1 − X} Zn _X Fe₂O₄) at x = (0.0, 0.1, 0.3, 0.4, 0.5, 0.6) where x is percentage of zinc in the ferrite. The dimension of samples was used according to the cavity of Network Analyzer System which were 22.6 × 10 × 10 mm to the X‐band cavity, then refine them to 15.5 × 10 × 10 mm within in the Ku‐band. The resonance peaks appeared at the frequencies 9, 10, 11, 14, 15, 16, and 17 GHz. It was found that the effect of increase sintering temperature increases the values of attenuation and absorbance with best result in behavior of absorbance for the sample Mg_0.6Zn_0.4Fe₂O₄ at the range of X‐band. X‐ray diffraction results showed that the structure was polycrystalline.