We report on the concept design and the theoretical ray trace analysis of the complex solar X-ray and EUV imaging telescope (CSIT) which is composed of a grazing incidence optical system and a normal incidence optical system. The CSIT can image the full sun in the wavelength bands from 0.4 to 6 nm and one EUV wavelength of 19.5nm with the same detector. The CSIT is a compact structure and can satisfy top-level image quality requirements.

The purpose of polarization calibration is to measure the response matrix of an instrument and the deviation of noise to correct for subsequent flight measurements. The precision, however, is relative to the states of incident light. We investigate the influence of partially polarized light, in the presence of signal-independent additive noise or signal-dependent Poisson shot noise. We obtain the estimation precision for different numbers of the polarization state generators and analyzers in linear Stokes measurements. To reduce the influence of incident light, we suggest that the numbers of the polarization state generators and analyzers should be greater than or equal to 4. In particular, for an instrument including three polarizers oriented at 0°, 60°, and 120°, estimation precision is found to be dependent on the response matrix and incident polarization states.

The purpose of polarization calibration is to obtain the response matrix of an instrument such that the subsequent observation data can be corrected. The calibration precision, however, is partially restricted by the noise of the detector. We investigate the precision of the normalized response matrix in the presence of signal-independent additive noise or signal-dependent Poisson shot noise. The influences of the source intensity, type of noise, and calibration configuration on the precision are analyzed. We compare the theoretical model and the experimental measurements of the polarization calibration to show that the relative difference between the two is less than 16%. From this result, we can use the model to determine the minimum source intensity and choose the optimal configurations that provide the required precision.