Here, we demonstrate a microwave (MW) cavity interference enhancement method to image nano-defects on the surface of metal waveguide. The MW cavity interference system mainly consisted of a MW coaxial resonant cavity with a nano-probe. The MW signals have been evenly divided into two channels. One was the reference signal inputted into the MW waveguide and coupled into the MW cavity via the probe. Also, the coupling strength depends on the distance between the probe and the MW waveguide. Another one was directly inputted the MW cavity to interfere with the reference signal, and was enhanced in the cavity. Then, the surface topography of the metal waveguide was mapped by calculating the enhanced signals. In our experiment, a weak signal of ∼1 pW coupled from the waveguide can be detected by a MW cavity with the quality factor of ∼209. As a proof of application, the topography of nano-defects on the surface of metal waveguide in an MW chip has been mapped with a resolution of ∼15 nm. We have proved that this is a high-resolution, easy-to-manufacture, low-cost, and real-time online monitoring approach for online assessment and screening chips. This potentially has broad applications in the fields of chip manufacturing, chip inspection, nano-structure detection, and so on.

Three-dimensional (3D) information of the optical response in the nanometre scale is important in the field of nanophotonics science. Using photoinduced force microscopy (PiFM), we can visualize the nano-scale optical field using the optical gradient force between the tip and sample. Here, we demonstrate 3D photoinduced force field visualization around a quantum dot in the single-nanometre spatial resolution with heterodyne frequency modulation technique, using which, the effect of the photothermal expansion of the tip and sample in the ultra-high vacuum condition can be avoided. The obtained 3D mapping shows the spatially localized photoinduced interaction potential and force field vectors in the single nano-scale for composite quantum dots with photocatalytic activity. Furthermore, the spatial resolution of PiFM imaging achieved is ~0.7 nm. The single-nanometer scale photoinduced field visualization is crucial for applications such as photo catalysts, optical functional devices, and optical manipulation.

The strain has been employed for controlled modification of electronical and mechanical properties of two-dimensional (2D) materials. However, the thermal strain-engineered behaviors of the CVD-grown MoS ₂ have not been systematically explored. Here, we investigated the strain-induced structure and properties of CVD-grown triangular MoS ₂ flakes by several advanced atomic force microscopy. Two different kinds of flakes with sharp-corner or vein-like nanostructures are experimentally discovered due to the size-dependent strain behaviors. The critical size of these two kinds of flakes can be roughly estimated at ∼17 μ m. Within the small flakes, the sharp-corner regions show specific strain-modified properties due to the suffering of large tensile strain. While in the large MoS ₂ flakes, the complicated vein-like nanoripple structures were formed due to the interface slipping process under the larger tensile strain. Our work not only demonstrates the size-specific strain behaviors of MoS ₂ flakes but also sheds light on the artificial design and preparation of strain-engineered nanostructures for the devices based on the 2D materials.