Yield estimation is an essential preharvest practice among most large-scale farming companies, since it enables the predetermination of essential logistics to be allocated (i.e., transportation means, supplies, labor force, among others). An overestimation may thus incur further costs, whereas an underestimation entails potential crop waste. More interestingly, an accurate yield estimation enables stakeholders to better place themselves in the market. Yet, computer-aided precision farming is set to play a pivotal role in this respect. Kiwifruit represents a major produce in several countries (e.g., Italy, China, New and Zealand). However, up to date, the relevant literature remains short of a complete as well as automatic system for kiwifruit yield estimation. In this paper, we present a fully automatic and noninvasive computer vision system for kiwifruit yield estimation across a given orchard. It consists mainly of an optical sensor mounted on a minitractor that surveys the orchard of interest at a low pace. Afterwards, the acquired images are fed to a pipeline that incorporates image preprocessing, stitching, and fruit counting stages and outputs an estimated fruit count and yield estimation. Experimental results conducted on two large kiwifruit orchards confirm a high plausibility (i.e., errors of 6% and 15%) of the proposed system. The proposed yield estimation solution has been in commercial use for about 2 years. With respect to the traditional manual yield estimation carried out by kiwifruit companies, it was demonstrated to save a significant amount of time and cut down on estimation errors, especially when speaking of large-scale farming.

Precision agriculture represents a promising technological trend in which governments and local authorities are increasingly investing. In particular, optimising the use of pesticides and having localised models of plant disease are the most important goals for the farmers of the future. The Trentino province in Italy is known as a strong national producer of apples. Apple production has to face many issues, however, among which is apple scab. This disease depends mainly on leaf wetness data typically acquired by fixed sensors. Based on the exploitation of artificial neural networks, this work aims to spatially extend the measurements of such sensors across uncovered areas (areas deprived of sensors). Achieved results have been validated comparing the apple scab risk of the same zone using either real leaf wetness data and estimated data. Thanks to the proposed method, it is possible to get the most relevant parameter of apple scab risk in places where no leaf wetness sensor is available. Moreover, our method permits having a specific risk evaluation of apple scab infection for each orchard, leading to an optimization of the use of chemical pesticides.