Navid Asadizanjani received a Ph.D. degree in Mechanical Engineering from University of Connecticut, Storrs, CT, USA, in 2014. He is currently an Assistant Professor with the Electrical and Computer Engineering Department at University of Florida, Gainesville, FL, USA. His current research interest is primary on Physical Assurance and Inspection of Electronics. This includes wide range of products from electronic systems to devices. He is involved with counterfeit detection and prevention, system and chip level reverse engineering, Anti reverse engineering, etc. Dr. Asadizanjani has received and has been nominated for several best paper awards from the International Symposium on Hardware Oriented Security and Trust (HOST) and International Symposium on Flexible Automation (ISFA). He was also winner of the D.E. Crow Innovation award from University of Connecticut. He is currently the program chair of the IEEE PAINE conference and is serving on the technical program committee of several top conferences including the International Symposium of Testing and Failure Analysis (ISTFA) and IEEE Computing and Communication Workshop and Conference (CCWC).
Navid Asadizanjani received a Ph.D. degree in Mechanical Engineering from University of Connecticut, Storrs, CT, USA, in 2014. He is currently an Assistant Professor with the Electrical and Computer Engineering Department at University of Florida, Gainesville, FL, USA. His current research interest is primary on Physical Assurance and Inspection of Electronics. This includes wide range of products from electronic systems to devices. He is involved with counterfeit detection and prevention, system and chip level reverse engineering, Anti reverse engineering, etc. Dr. Asadizanjani has received and has been nominated for several best paper awards from the International Symposium on Hardware Oriented Security and Trust (HOST) and International Symposium on Flexible Automation (ISFA). He was also winner of the D.E. Crow Innovation award from University of Connecticut. He is currently the program chair of the IEEE PAINE conference and is serving on the technical program committee of several top conferences including the International Symposium of Testing and Failure Analysis (ISTFA) and IEEE Computing and Communication Workshop and Conference (CCWC).