We synthesize and optically characterize pure PMMA and PMMA incorporated with metal oxides nanoparticles (MO NPs) such as ZnO, CuO, TiO2 and SiO2 NPs nanocomposite thin films with weight concentration of 10% using dip-coating technique. SEM images of MO NPs show that all NPs have nearly an average size of around 50 nm. The optical parameters such as, optical parameters (n and k), optoelectronics properties, dispersion, band-gap energy and band structure of as-prepared nanocomposite thin films were determined by analyzing the transmittance and reflectance spectra. Mainly, optical band-gap energy (Eg) and the thickness of thin films are evaluated to a high degree of accuracy by utilizing Q-functional derived using a mathematical model recently published. The Q(E) is a functional containing experimental transmission and reflection data and the incident photon energy. The Eg value of un-doped PMMA thin films is found to be 4.273 eV. This value decreases as pre-selected MO NPs are introduced into thin films. These values are in excellent agreement with those determined using Tauc method. The FTIR technique is employed to elucidate the vibrational bands of the nanocomposites and the intermolecular bonding between PMMA matrix and the MOs NPs. Thermal stability is investigated by employing thermogravimetric analysis (TGA) at temperatures up to 400 °C. The obtained TGA thermograms indicate that adding MOs NPs to PMMA yield thin films of better thermal stability. The obtained doped thin films show a great promise for fabricating high-efficient optoelectronic devices.

Sol-gel technique is used to synthesize as-grown zinc oxide (ZnO) and iron-nickel (Fe-Ni) co-doped ZnO thin films deposited on glass substrates using dip coating technique. The structural properties and crystal imperfections of as-prepared thin films are investigated. We performed the structural analysis of films using X-ray diffraction (XRD). The XRD analysis reveal that the as-prepared films exhibit wurtzite structure. Furthermore, XRD-line profile analysis is performed to study the correlation between structural properties and imperfections of the nanocomposite thin films. The crystallite size and microstrains parameters are predicted using the Williamson–Hall method. We found that the crystallites size increases as the co-doped (Fe-Ni) concentration is increased. However, microstrains of the nanocomposite films decreases as (Fe-Ni) concentration is increased. The optical properties of the (Fe-Ni) co-doped nanocomposite films are investigated by performing UV-Vis (250 nm–700 nm) spectrophotometer measurements. We found that as the (Fe-Ni) concentration level is steadily increased, transmittance of the undoped ZnO thin films is decreased. Remarkably, refractive index of undoped ZnO thin films is found to exhibit values extending from 1.55 to1.88 that would increase as (Fe-Ni) concentration is increased.

We report the synthesis of hybrid thin films based on Poly(MethylMethAcrylate) (PMMA) and Poly(VinylAlcohol) (PVA), doped with different concentrations of titanium dioxide nanoparticles (TiO₂ NPs). As-prepared thin films of (PMMA-PVA) doped by TiO₂ NPs (wt.% = 2%, 4%, 8%, and 16%) are deposited on glass substrate. Transmittance (T%), reflectance (R%), absorption coefficient (α), optical constants (n and k), and optical dielectric functions (ε₁ and ε₂) are deduced using the experimental transmittance and reflectance spectra. Furthermore, a combination of classical models such as Tauc, Urbach, Spitzer-Fan, and Drude models are applied to calculate the optical and optoelectronic parameters and the energy gaps of the prepared nanocomposite thin films. The optical bandgap energy of PMMA-PVA thin film is found to be 4.101 eV. Incorporation of TiO₂ NPs into PMMA-PVA polymeric thin films leads to a decrease in the optical bandgap and thus bandgap engineering is possible. Fourier-transform infrared spectroscopy (FTIR) transmittance spectra of thin films are measured and interpreted to identify the vibrational modes. To elucidate the chemical stability, thermogravimetric (TGA) curves are measured. We found that (PMMA-PVA)/TiO₂ NPs polymeric thin films are thermally stable below 110 °C enable them to be attractive for a wide range of optical and optoelectronic applications.

Undoped ZnO and group III (B, Al, Ga, and In)-doped ZnO thin films at 3% doping concentration level are dip-coated on glass substrates using a sol-gel technique. The optical properties of the as-prepared thin films are investigated using UV–Vis spectrophotometer measurements. Transmittance of all investigated thin films is found to attain high values of ≥80% in the visible region. We found that the index of refraction of undoped ZnO films exhibits values ranging between 1.6 and 2.2 and approximately match that of bulk ZnO. Furthermore, we measure and interpret nonlinear optical parameters and the electrical and optical conductivities of the investigated thin films to obtain a deeper insight from fundamental and practical points of view. In addition, the structural properties of all studied thin film samples are investigated using the XRD technique. In particular, undoped ZnO thin film is found to exhibit a hexagonal structure. Due to the large difference in size of boron and indium compared with that of zinc, doping ZnO thin films with these two elements is expected to cause a phase transition. However, Al-doped ZnO and Ga-doped ZnO thin films preserve the hexagonal phase. Moreover, as boron and indium are introduced in ZnO thin films, the grain size increases. On the other hand, grain size is found to decrease upon doping ZnO with aluminum and gallium. The drastic enhancement of optical properties of annealed dip-synthesized undoped ZnO thin films upon doping with group III metals paves the way to tune these properties in a skillful manner, in order to be used as key candidate materials in the fabrication of modern optoelectronic devices.