Marta Rępalska

Dr. Marta Rępalska


Research Focus & Metrics

Academic Career Length

2Years (2025-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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8 December 2025 in Sensors
Verified
Journal Article
Open access
PDF file
Dawid KucharskiDawid Kucharski
Dawid Kucharski
Adam GąskaAdam Gąska
Adam Gąska
TKTomasz Kowaluk
Tomasz Kowaluk
KSKrzysztof Stepien
Krzysztof Stepien
MRMarta Rępalska
Marta Rępalska
AWAdam Wiesław Wójtowicz
Adam Wiesław Wójtowicz
A reproducible deep learning framework is presented for surface metrology to predict surface texture parameters together with their reported standard uncertainties. Using a multi-instrument dataset spanning tactile and optical systems, we jointly address measurement system type classification and regression of key surface parameters—arithmetic mean roughness (Ra), mean peak-to-valley roughness (Rz), and total roundness deviation (RONt)—alongside their reported standard uncertainties. Uncertainty is modelled via quantile and heteroscedastic regression heads, with post hoc conformal calibration used to obtain calibrated prediction intervals. On a held-out test set, high fidelity was achieved by single-target regressors (coefficients of determination: Ra 0.9824, Rz 0.9847, RONt 0.9918), with two uncertainty targets also well modelled (standard uncertainty of Ra 0.9899, standard uncertainty of Rz 0.9955); the standard uncertainty of RONt remained more difficult to learn (0.4934). The classifier reached 92.85% accuracy, and probability calibration was essentially unchanged after temperature scaling (expected calibration error 0.00504 → 0.00503 on the test split). Negative transfer was observed for naive multi-output trunks, with single-target models performing better. These results provide calibrated predictions suitable for informing instrument selection and acceptance decisions in metrological workflows.