Fourier transform (FT) is a fundamental step for the data reduction and interpretation of extended x-ray absorption fine structure (EXAFS) spectra. The FT separates backscattering atoms by their radial distance from the absorbing atom (so-called shells). We suggest to routinely complement the FT by a wavelet transform (WT), which provides not only radial distance resolution, but resolves in $k$ space. This information eases the discrimination of atoms by their elemental nature, especially if these atoms are at the same distance. We present an in-depth analysis of the Morlet wavelet, which has specific advantages for EXAFS analysis, including the possibility to estimate Morlet parameter values optimized either for elemental or for spatial resolution. Using an experimental spectrum of $\mathrm{Zn}\text{−}\mathrm{Al}$ layered double hydroxide, we demonstrate the discrimination of $\mathrm{Al}$ and $\mathrm{Zn}$ at a similar crystallographic position, in spite of destructive interference substantially reducing signal information. Finally, the extension to multiple scattering paths leads to a deeper understanding of the resolution properties of the WT.

Conventional x-ray transmission tomography provides the spatial distribution of the absorption coefficient inside a sample. Other tomographic techniques, based on the detection of photons coming from fluorescent emission, Compton and Rayleigh scattering, are used for obtaining information on the internal elemental composition of the sample. However, the reconstruction problem for these techniques is generally much more difficult than that of transmission tomography, mainly due to self-absorption effects in the sample. In this article an approach to the reconstruction problem is presented, which integrates the information from the three types of signals. This method provides the quantitative spatial distribution of all elements that emit detectable fluorescent lines (Z⩾15 in usual experimental conditions), even when the absorption effects are strong, and the spatial distribution of the global density of the lighter elements. The use of this technique is demonstrated on the reconstruction of a grain of the martian meteorite NWA817, mainly composed of low Z elements not measured in fluorescence and for which this method provides a unique insight. The measurement was done at the ID22 beamline of the European Synchrotron Radiation Facility.

The technological success of phase-change materials in the field of data storage and functional systems stems from their distinctive electronic and structural peculiarities on the nanoscale. Recently, superlattice structures have been demonstrated to dramatically improve the optical and electrical performances of these chalcogenide based phase-change materials. In this perspective, unravelling the atomistic structure that originates the improvements in switching time and switching energy is paramount in order to design nanoscale structures with even enhanced functional properties. This study reveals a high- resolution atomistic insight of the [GeTe/Sb₂Te₃] interfacial structure by means of Extended X-Ray Absorption Fine Structure spectroscopy and Transmission Electron Microscopy. Based on our results we propose a consistent novel structure for this kind of chalcogenide superlattices.