Mirrors are a subset of optical components essential for the success of current and future space missions. Most of the telescopes for space programs ranging from earth observation to astrophysics and covering the whole electromagnetic spectrum from x-rays to far-infrared are based on reflective optics. Mirrors operate in diverse and harsh environments that range from low-earth orbit to interplanetary orbits and deep space. The operational life of space observatories spans from minutes (sounding rockets) to decades (large observatories), and the performance of the mirrors within the mission lifetime is susceptible to degrading, resulting in a drop in the instrument throughput, which in turn affects the scientific return. Therefore, the knowledge of potential degradation mechanisms, how they affect mirror performance, and how to prevent them is of paramount importance to ensure the long-term success of space telescopes. In this review, we report an overview of current mirror technology for space missions with a focus on the importance of the degradation and radiation resistance of coating materials. Special attention is given to degradation effects on mirrors for far and extreme UV, as in these ranges the degradation is enhanced by the strong absorption of most contaminants.

Transmissive dielectric wire grid polarizers tuned to 4.43 eV (Mg II line, 280 nm), an important diagnostic line for solar physics, are presented in this communication. The polarizers are based on TiO₂ gratings and designed with a period of ∼140 nm (7143 lines/mm), 40 nm line width (duty cycle of 0.286), and 100 nm line height. Several gratings are fabricated through electron beam lithography combined with reactive ion etching, whereby two parameters in the nanofabrication process are explored: e-beam dosage on the photoresist and TiO₂ etching time. Polarization of samples is optically characterized using a spectroscopic ellipsometer in transmission mode, achieving the best result with an extinction ratio of ∼109 and a transmittance of 16.4% at the target energy of 4.43 eV. The shape of the gratings is characterized through atomic force microscopy (AFM) and scanning electron microscopy (SEM); the measured AFM profiles are distorted by the tip geometry, hence a simple deconvolution procedure is implemented to retrieve the real profile. By analysing the AFM and SEM profiles, we find that the real shapes of the different gratings are close to the design, but with a larger duty cycle than the intended value. With the real grating geometry, an improved model of the best sample was built with a finite-difference time-domain (FDTD) method that matches the result obtained through optical characterization.