This review addresses the importance of Zn for obtaining multifunctional materials with interesting properties by following certain preparation strategies: choosing the appropriate synthesis route, doping and co-doping of ZnO films to achieve conductive oxide materials with p- or n-type conductivity, and finally adding polymers in the oxide systems for piezoelectricity enhancement. We mainly followed the results of studies of the last ten years through chemical routes, especially by sol-gel and hydrothermal synthesis. Zinc is an essential element that has a special importance for developing multifunctional materials with various applications. ZnO can be used for the deposition of thin films or for obtaining mixed layers by combining ZnO with other oxides (ZnO-SnO₂, ZnO-CuO). Also, composite films can be achieved by mixing ZnO with polymers. It can be doped with metals (Li, Na, Mg, Al) or non-metals (B, N, P). Zn is easily incorporated in a matrix and therefore it can be used as a dopant for other oxidic materials, such as: ITO, CuO, BiFeO_3, and NiO. ZnO can be very useful as a seed layer, for good adherence of the main layer to the substrate, generating nucleation sites for nanowires growth. Thanks to its interesting properties, ZnO is a material with multiple applications in various fields: sensing technology, piezoelectric devices, transparent conductive oxides, solar cells, and photoluminescence applications. Its versatility is the main message of this review.

${\text{Al}}_{1-x}{\text{In}}_x\text{N}$ layers with an indium content between $x=10.5\mathrm{\%}$ and $x=24\mathrm{\%}$ were grown by metal-organic vapor-phase epitaxy and characterized concerning their optical, structural and morphological properties with regard to the realization of optoelectronic devices. The indium content and the strain of these layers were measured by high resolution x-ray diffraction. Ellipsometric measurements were used to determine the optical constants [refractive index $n\left(\lambda \right)$ and extinction coefficient $\kappa \left(\lambda \right)$ ] in dependence of wavelength and indium content. The values determined for the electronic bandgaps are in good agreement with theoretical predictions and previous publications on this topic but are more focused on AlInN layers which are pseudomorphically grown on GaN. A bowing parameter of $b=10.3\pm 0.1$ was determined for fully strained layers with an indium content between 13% and 24%. In order to investigate the suitability of these layers for use in distributed Bragg reflectors, the surface morphology is characterized with respect to the indium content. Furthermore, the influence of an annealing step which often is necessary during device growth, was studied. The influence of this annealing step on the roughness was analyzed by atomic force microscopy, while structural features are monitored by high resolution secondary electron microscopy images. Based on these results distributed Bragg reflectors for the green spectral region with up to 40 pairs and a peak reflectivity of 97% have been realized. Transmission electron microscopic analysis of the layer interfaces are in good agreement with the atomic force and secondary electron microscopy images of the single layer surfaces.