Peter Bajcsy received his Ph.D. in Electrical and Computer Engineering in 1997 from the University of Illinois at Urbana-Champaign (UIUC) and a M.S. in Electrical and Computer Engineering in 1994 from the University of Pennsylvania (UPENN). He worked for machine vision, government contracting, and research and educational institutions before joining NIST in June 2011. At NIST, he has been leading a project focusing on the application of computational science in metrology, and specifically image-based live cell and material characterization at very large scales. Peter’s area of research is large-scale image-based analyses and syntheses using mathematical, statistical, and computational models while leveraging computer science fields such as image processing, machine learning, computer vision, and pattern recognition.