The application of white box models in digital twins is often hindered by missing knowledge, uncertain information and computational difficulties. Our aim was to overview the difficulties and challenges regarding the modelling aspects of digital twin applications and to explore the fields where surrogate models can be utilised advantageously. In this sense, the paper discusses what types of surrogate models are suitable for different practical problems as well as introduces the appropriate techniques for building and using these models. A number of examples of digital twin applications from both continuous processes and discrete manufacturing are presented to underline the potentials of utilising surrogate models. The surrogate models and model-building methods are categorised according to the area of applications. The importance of keeping these models up to date through their whole model life cycle is also highlighted. An industrial case study is also presented to demonstrate the applicability of the concept.

In this article, the authors focus on the introduction of a hybrid method for risk-based fault detection (FD) using dynamic principal component analysis (DPCA) and failure method and effect analysis (FMEA) based Bayesian networks (BNs). The FD problem has garnered great interest in industrial application, yet methods for integrating process risk into the detection procedure are still scarce. It is, however, critical to assess the risk each possible process fault holds to differentiate between non-safety-critical and safety-critical abnormalities and thus minimize alarm rates. The proposed method utilizes a BN established through FMEA analysis of the supervised process and the results of dynamical principal component analysis to estimate a modified risk priority number (RPN) of different process states. The RPN is used parallel to the FD procedure, incorporating the results of both to differentiate between process abnormalities and highlight critical issues. The method is showcased using an industrial benchmark problem as well as the model of a reactor utilized in the emerging liquid organic hydrogen carrier (LOHC) technology.