Thomas Gemming was born in Stuttgart, Germany, in 1969. He studied physics at the University Karlsruhe (TH), Karlsruhe, Germany, and received his diploma in 1994 from the Institute for Technology of Electrical Engineering, Karlsruhe, Germany, on the topic of electroceramics. In 1998 he received his doctoral degree in chemistry from the University of Stuttgart, Germany. From 1994 to 2000, he worked at the Max-Planck-Institut für Metallforschung in Stuttgart. In 2000, he joined the Institute for Solid State and Material Research (IFW) Dresden where he is currently heading the Department for Surface and Microarea Analysis. His research interests cover the quantitative analysis of nanoscaled or layered structural and functional materials by various microscopy and spectroscopy techniques. Furthermore, he is interested in the properties of grain boundaries and their impact on the properties of materials. He is a member of the German Electron Microscopy Society and the German Physical Society.
Thomas Gemming was born in Stuttgart, Germany, in 1969. He studied physics at the University Karlsruhe (TH), Karlsruhe, Germany, and received his diploma in 1994 from the Institute for Technology of Electrical Engineering, Karlsruhe, Germany, on the topic of electroceramics. In 1998 he received his doctoral degree in chemistry from the University of Stuttgart, Germany. From 1994 to 2000, he worked at the Max-Planck-Institut für Metallforschung in Stuttgart. In 2000, he joined the Institute for Solid State and Material Research (IFW) Dresden where he is currently heading the Department for Surface and Microarea Analysis. His research interests cover the quantitative analysis of nanoscaled or layered structural and functional materials by various microscopy and spectroscopy techniques. Furthermore, he is interested in the properties of grain boundaries and their impact on the properties of materials. He is a member of the German Electron Microscopy Society and the German Physical Society.