Giuseppe Lannaccone

Prof. Dr. Giuseppe Lannaccone

Department of Information Engineering, University of Pisa, 56122 Pisa, Italy

Research Focus & Metrics

Academic Career Length

33Years (1994-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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6 October 2014 in Nature Nanotechnology
Verified
Journal Article
Closed access
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GFGianluca Fiori
Gianluca Fiori
FBFrancesco Bonaccorso
Francesco Bonaccorso
Giuseppe LannacconeGiuseppe Lannaccone
Giuseppe Lannaccone
TPTomas Palacios
Tomas Palacios
DNDaniel Neumaier
Daniel Neumaier
LCLuigi Colombo
Luigi Colombo

30 January 2017 in Nature Nanotechnology
Verified
Journal Article
Closed access
DMDaryl McManus
Daryl McManus
SVSandra Vranic
Sandra Vranic
FWFreddie Withers
Freddie Withers
VSVeronica Sanchez-Romaguera
Veronica Sanchez-Romaguera
MMMassimo Macucci
Massimo Macucci
CCCinzia Casiraghi
Cinzia Casiraghi

6 March 2018 in Nature Nanotechnology
Verified
Journal Article
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PDF file
Giuseppe LannacconeGiuseppe Lannaccone
Giuseppe Lannaccone
FBFrancesco Bonaccorso
Francesco Bonaccorso
LCLuigi Colombo
Luigi Colombo
GFGianluca Fiori
Gianluca Fiori

25 August 2016 in Nature Communications
Verified
Journal Article
Open access
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GPGiovanni Pizzi
Giovanni Pizzi
MGMarco Gibertini
Marco Gibertini
EDElias Dib
Elias Dib
NMNicola Marzari
Nicola Marzari
Giuseppe LannacconeGiuseppe Lannaccone
Giuseppe Lannaccone
GFGianluca Fiori
Gianluca Fiori
In the race towards high-performance ultra-scaled devices, two-dimensional materials offer an alternative paradigm thanks to their atomic thickness suppressing short-channel effects. It is thus urgent to study the most promising candidates in realistic configurations, and here we present detailed multiscale simulations of field-effect transistors based on arsenene and antimonene monolayers as channels. The accuracy of first-principles approaches in describing electronic properties is combined with the efficiency of tight-binding Hamiltonians based on maximally localized Wannier functions to compute the transport properties of the devices. These simulations provide for the first time estimates on the upper limits for the electron and hole mobilities in the Takagi’s approximation, including spin–orbit and multi-valley effects, and demonstrate that ultra-scaled devices in the sub-10-nm scale show a performance that is compliant with industry requirements.

6 September 2005 in IEEE Transactions on Microwave Theory and Techniques
Verified
Journal Article
Closed access
GVG. De Vita
G. De Vita
Giuseppe LannacconeGiuseppe Lannaccone
Giuseppe Lannaccone
A set of design criteria for the radio-frequency (RF) section of long-range passive RF identification (RFID) transponders operating in the 2.45-GHz or 868-MHz industrial, scientific, and medical (ISM) frequency ranges is derived in this paper, focusing in particular on the voltage multiplier, the power-matching network, and the backscatter modulation. The paper discusses the design tradeoffs between the error probability at the reader receiver and the converted RF-dc power at the transponder, determining the regions of the design space that allow optimization of the operating range and the data rate of the RFID system.

23 July 2007 in IEEE Electron Device Letters
Verified
Journal Article
Closed access
GFGianluca Fiori
Gianluca Fiori
Giuseppe LannacconeGiuseppe Lannaccone
Giuseppe Lannaccone
We present an atomistic 3-D simulation of graphene nanoribbon field-effect transistors (GNR-FETs), based on the self consistent solution of the 3-D Poisson and Schrodinger equations with open boundary conditions within the nonequilibrium Green's function formalism and a tight-binding Hamiltonian. With respect to carbon nanotube FETs, GNR-FETs exhibit comparable performance, reduced sensitivity to the variability of channel chirality, and similar leakage problems due to band-to-band tunneling. Acceptable transistor performance requires prohibitive effective nanoribbon width of 1-2 nm and atomistic precision that could in principle be obtained with periodic etch patterns or stress patterns.