The optical vector analyzer is a device used to measure the magnitude, phase responses, and other parameters of optical devices. There have been increasingly higher demands placed on optical vector analyzers during the development of optical technologies, which are satisfied by the creation of new devices and their operating principles. For further development in this area, it is necessary to generalize the experience gained during the development of optical vector analyzers. Thus, in this report, we provide an overview of all the basic types of approaches used for the realization of optical vector analyzers, including the advanced ones with the best performances. The principles of their working, as well as their associated advantages, disadvantages, and existing solutions to the identified problems, are examined in detail. The presented approaches could be of value and interest to those working in the field of laser dynamics and optical devices, as we propose one use of the optical vector analyzer as being the characterization of Fano resonance structures.

Nonlinear spectrum distortions are caused by the peculiarities of the operation of charge-coupled device elements (CCD), in which the signal exposition time (Time of INTegration–TINT) is one of the significant parameters. A change of TINT on a CCD leads to a nonlinear distortion of the resulting spectrum. A nonlinear distortion of the spectrum, in turn, leads to errors in determining the central wavelength of fiber Bragg gratings (FBGs) and spectrally sensitive sensors, which, in general, negatively affects the accuracy of the measuring systems. This paper proposes an algorithm for correcting the nonlinear distortions of the spectrum obtained on a spectrum analyzer using CCD as a receiver. It is shown that preliminary calibration of the optical spectrum analyzer with subsequent mathematical processing of the signal makes it possible to make corrections in the resulting spectrum, thereby leveling the errors caused by measurements at different TINT.

Photonic-assisted receivers for instantaneous microwave frequency measurement are devices used to measure the instantaneous frequency and amplitude of one or more microwave signals in the optical range, typically used in radar systems. Increasingly higher demands are placed on frequency range, accuracy and resolution during the development of instantaneous microwave frequency measurement applications, and these demands can be satisfied by the creation of new devices and operating principles. To permit further development in this area, it is necessary to generalize the experience gained during the development of devices based on frequency and amplitude discriminators of resonance type, including advanced ones with the best performances. Thus, in this report, we provide an overview of all the basic types of approaches used for the realization of photonic-assisted receivers based on fiber Bragg gratings, integrated Fano and optical ring resonators, Brillouin gain spectrum, and so on. The principles of their operation, as well as their associated advantages, disadvantages, and existing solutions to identified problems, are examined in detail. The presented approaches could be of value and interest to those working in the field of microwave photonics and radar systems, as we propose an original method for choosing photonic-assisted receivers appropriate for the characterization of multiple frequency measurements.

This work presents a fabricated silica few-mode microstructured optical fiber (MOF) with a special six GeO₂-doped core geometry, an outer diameter of 125 µm (that corresponds to conventional commercially available telecommunication optical fibers), and improved induced twisting up to 500 revolutions per 1 m (under a rotation speed of 1000 revolutions per meter with a drawing speed of ~2 m per minute). The article discusses some technological aspects and issues of manufacturing the above-described twisted MOFs with complicated structures and geometry as GeO₂-doped silica supporting elements for them. We present results of some measurements performed for fabricated samples of chiral silica six-GeO₂-doped-core few-mode MOFs with various orders of twisting and both step and graded refractive indexes of “cores”. These tests contain research on MOF geometrical parameters, attenuation, and measurements of the far-field laser beam profile.

Nonlinear spectrum distortions are caused by the peculiarities of the operation of charge-coupled device elements (CCD), in which the signal exposition time (TINT) is one of the significant parameters. A change of TINT on a CCD leads to a nonlinear distortion of the resulting spectrum. Nonlinear distortion of the spectrum, in its turn, leads to errors in determining the central wavelength of Fiber Bragg Gratings (FBG) and spectrally sensitive sensors, which, in general, negatively affects the accuracy of measuring systems. The paper proposes an algorithm for correcting nonlinear distortions of the spectrum obtained on a spectrum analyzer using CCD as a receiver. It is shown that preliminary calibration of the optical spectrum analyzer with subsequent mathematical processing of the signal makes it possible to make corrections in the resulting spectrum, thereby leveling the errors caused by measurements at different TINT.