Approaches that are, to our knowledge, novel, are proposed in this paper to improve the accuracy performance of self-mixing interferometry (SMI) for displacement measurement. First, the characteristics associated with signals observed in SMI systems are studied, based on which a new procedure is proposed for achieving accurate estimation of the laser phase. The studies also revealed the reasons for the inherent errors associated with the existing SMI-based techniques for displacement measurement. Then, this paper presents a new method for estimating the optical feedback level factor (denoted by C) in real time. Combining the new algorithms for estimating the laser phase and updating C value, the paper finally presents a novel technique for displacement measurement with improved accuracy performance in contrast to existing techniques. The proposed technique is verified by both simulation and experimental data.

To achieve complete security of communication, there is a need for “real-time” ultrafast physical random bit generators (RBGs). In the available physical RBGs, random bit extraction is effected in the electrical domain and, therefore, cannot directly function beyond the frequencies of 10 GHz or so in real time. Here, we present a fully photonic strategy for real-time random number generation and report a proof-of-concept experimental demonstration of an integrated 10 Gb/s RBG system (prototype) based on laser chaos. The use of an ultrastable mode-locked laser, together with ultrafast optical interactions, gives our method the capability to develop super-high-speed RBGs in practice. The photonic implementation is fully compatible with optical communications so that well-established optical multiplexing techniques can be used to realize Tb/s real-time random bit generation.

A self-mixing interferometry (SMI) system is a laser diode (LD) with an external cavity formed by a moving external target. The behavior of an SMI system is governed by the injection current $J$ to the LD and the parameters associated with the external cavity mainly including optical feedback factor $C$, the initial external cavity length ($L_0$) and the light phase (${\varphi }_0$) which is mapped to the movement of the target. In this paper, we investigate the dynamic behavior of an SMI system by using the Lang-Kobayashi model. The stability boundary of such system is presented in the plane of ($C$, ${\varphi }_0$), from which a critical $C$ (denoted as $C_{critical}$) is derived. Both simulations and experiments show that the stability can be enhanced by increasing either $L_0$ or $J$. Furthermore, three regions on the plane of ($C$, ${\varphi }_0$) are proposed to characterize the behavior of an SMI system, including stable, semi-stable and unstable regions. We found that the existing SMI model is only valid for the stable region, and the semi-stable region has potential applications on sensing and measurement but needs re-modeling the system by considering the bandwidth of the detection components.

A simple method for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SLs) is proposed and demonstrated in this paper. This method is based on the self-mixing effect when a small portion of optical signal intensity emitted by the SL reflected by the moving target re-enters the SL cavity, leading to a modulation in the SL’s output power intensity, in which the modulated envelope shape depends on the optical feedback strength as well as the LEF. By investigating the relationship between the light phase and power from the well-known Lang and Kobayashi equations, it was found that the LEF can be simply measured from the power value overlapped by two SLs’ output power under two different optical feedback strengths. Our proposed method is verified by both simulations and experiments.

We propose a real-time self-balanced photonic method for extracting ultrafast random numbers from broadband randomness sources. In place of electronic analog-to-digital converters (ADCs), the balanced photo-detection technology is used to directly quantize optically sampled chaotic pulses into a continuous random number stream. Benefitting from ultrafast photo-detection, our method can efficiently eliminate the generation rate bottleneck from electronic ADCs which are required in nearly all the available fast physical random number generators. A proof-of-principle experiment demonstrates that using our approach 10 Gb/s real-time and statistically unbiased random numbers are successfully extracted from a bandwidth-enhanced chaotic source. The generation rate achieved experimentally here is being limited by the bandwidth of the chaotic source. The method described has the potential to attain a real-time rate of 100 Gb/s.

Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve a product to the desired specification via real time production control. There are several different coating thickness measurement methods that can be used, either in-line or off-line, which can determine the coating thickness relative to the material of the coating and the substrate. In-line coating thickness measurement methods are often very difficult to design and implement due to the nature of the harsh environmental conditions of typical production processes and the speed at which the process is run. This paper addresses the current and novel coating thickness methodologies for application to chromium coatings on a ferro-magnetic steel substrate with their advantages and limitations regarding in-line measurement. The most common in-line coating thickness measurement method utilized within the steel packaging industry is the X-ray Fluorescence (XRF) method, but these systems can become costly when implemented for a wide packaging product and pose health and safety concerns due to its ionizing radiation. As technology advances, nanometer-scale coatings are becoming more common, and here three methods are highlighted, which have been used extensively in other industries (with several variants in their design) which can potentially measure coatings of nanometer thickness in a production line, precisely, safely, and do so in a non-contact and non-destructive manner. These methods are optical reflectometry, ellipsometry and interferometry.