Tim Claeys (Member, IEEE) was born in 1990. He received an M.S. degree in industrial engineering sciences, option electronics, from the University College Katholieke Hogeschool Sint-Lieven Gent, Ghent, Belgium, in 2013, and a Ph.D. degree in electrical engineering from KU Leuven, Leuven, Belgium, in 2018. Since 2018, he has been a Postdoctoral Researcher with the M-Group Research Group (Lab FMEC), KU Leuven. His current research interests include near-field scanning, the development of characterization methods for shielding materials and gaskets, electromagnetic interference resilience of wireless protocols, and global reliability of electronic systems. Dr. Claeys is a part of the IEEE EMC Society Benelux chapter.
Tim Claeys (Member, IEEE) was born in 1990. He received an M.S. degree in industrial engineering sciences, option electronics, from the University College Katholieke Hogeschool Sint-Lieven Gent, Ghent, Belgium, in 2013, and a Ph.D. degree in electrical engineering from KU Leuven, Leuven, Belgium, in 2018. Since 2018, he has been a Postdoctoral Researcher with the M-Group Research Group (Lab FMEC), KU Leuven. His current research interests include near-field scanning, the development of characterization methods for shielding materials and gaskets, electromagnetic interference resilience of wireless protocols, and global reliability of electronic systems. Dr. Claeys is a part of the IEEE EMC Society Benelux chapter.