Christina Villeneuve-Faure was born in Montauban, France in 1981. She received an engineering degree in materials and nanophysics from Institut National Polytechnique Grenoble in 2004 and aPh.D. degree in material physics from the University of Toulouse in 2007. After 4 years at a post-doctoral position in LAAS-CNRS on MEMS reliability, she is, since 2011, an associate professor in LAPLACE, France. Her researches focus on AFM characterization of electrical properties of thin dielectric and semiconductor films.