In this paper, we report a novel design of bismuth nanoparticle-passivated silicon nanowire (Bi@SiNW) heterojunction composites for high diode performances and improved effective carrier lifetime and absorption properties. High-density vertically aligned SiNWs were fabricated using a simple and cost-effective silver-assisted chemical etching method. Bi nanoparticles (BiNPs) were then anchored in these nanowires by a straightforward thermal evaporation technique. The systematic study of the morphology, elemental composition, structure, and crystallinity provided evidence for the synergistic effect between SiNWs and BiNPs. Bi@SiNWs exhibited an eight-fold enhancement of the first-order Raman scattering compared to bare silicon. Current–voltage characteristics highlighted that bismuth treatment dramatically improved the rectifying behavior and diode parameters for Bi-passivated devices over Bi-free devices. Significantly, Bi wire-filling effectively increased the minority carrier lifetime and consequently reduced the surface recombination velocity, further indicating the benign role of Bi as a surface passivation coating. Furthermore, the near-perfect absorption property of up to 97% was achieved. The findings showed that a judicious amount of Bi coating is required. In this study the reasons behind the superior improvement in Bi@SiNW’s overall properties were elucidated thoroughly. Thus, Bi@SiNW heterojunction nanocomposites could be introduced as a promising and versatile candidate for nanoelectronics, photovoltaics and optoelectronics.

An easy and low-cost way to fabricate monometallic Au nanoislands for plasmonic enhanced spectroscopy is presented. The method is based on direct thermal evaporation of Au on glass substrates to form nanoislands, with thicknesses between 2 and 15 nm, which are subsequently covered by a thin layer of silicon dioxide. We have used HR-SEM and AFM to characterize the nanoislands, and their optical transmission reveals strong plasmon resonances in the visible. The plasmonic performance of the fabricated substrates has been tested in fluorescence and Raman scattering measurements of two probe materials. Enhancement factors up to 1.8 and 9×10⁴ are reported for confocal fluorescence and Raman microscopies, respectively, which are comparable to others obtained by more elaborated fabrication procedures.