Metal halide perovskite single crystals are a promising candidate for X-ray detection due to their large atomic number and high carrier mobility and lifetime. However, it is still challenging to grow large-area and thin single crystals directly onto substrates to meet real-world applications. In this work, millimeter-thick and inch-sized methylammonium lead tribromide (MAPbBr₃) single-crystal wafers are grown directly on indium tin oxide (ITO) substrates through controlling the distance between solution surface and substrates. The single-crystal wafers are polished and treated with O₃ to achieve smooth surface, lower trap density, and better electrical properties. X-ray detectors with a high sensitivity of 632 µC Gy_air⁻¹ cm⁻² under –5 V and 525 µC Gy_air⁻¹ cm⁻² under –1 V bias can be achieved. This work provides an effective way to fabricate substrate-integrated, large-area, and thickness-controlled perovskite single-crystal X-ray detectors, which is instructive for developing imaging application based on perovskite single crystals.

A {Tb₃}[Ga_0.1Sc_1.9](Al₃)O₁₂ crystal is designed and investigated for the first time. This novel single crystal exhibits excellent magneto-optical properties and is very promising for visible near-infrared Faraday applications.

High-performance magneto-optical materials are in urgent demand for high-power Faraday isolators. The traditional Tb₃Ga₅O₁₂ crystal presents a relatively low Verdet constant and large absorption coefficient, which makes it difficult to meet the continuous development of high-power lasers. In this work, novel Tb₃(Al_xGa₁)₅O₁₂ (TAGG) single crystals are grown by the Czochralski method. High-quality TAGG crystals with Al-substitution of up to 75% are obtained for the first time. The optical, thermal, and magneto-optical properties are significantly enhanced through high Al incorporation. This work demonstrates that the highly Al-substituted TAGG single crystals are remarkable magneto-optical materials for Faraday isolators.