Patrick Schaumont

Prof. Patrick Schaumont

orcid

Research Focus & Metrics

Academic Career Length

32Years (1995-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications

1 June 2010
Verified
Conference Paper
Closed access
AMAbhranil Maiti
Abhranil Maiti
JCJeff Casarona
Jeff Casarona
LMLuke McHale
Luke McHale
PSPatrick Schaumont
Patrick Schaumont
To validate the effectiveness of a Physical Unclonable Function (PUF), it needs to be characterized over a large population of chips. Though simulation methods can provide approximate results, an on-chip experiment produces more accurate result. In this paper, we characterize a PUF based on ring oscillator (RO) using a significantly large population of 125 FPGAs. We analyze the experimental data using a ring oscillator loop delay model, and quantify the quality factors of a PUF such as uniqueness and reliability. The RO-PUF shows an average inter-die Hamming distance of 47.31%, and an average intra-die Hamming distance of 0.86% at normal operating condition. Additionally, we intend to make this large RO frequency dataset available publicly for the research community.

14 October 2010 in Journal of Cryptology
Verified
Journal Article
Closed access
PDF file
AMAbhranil Maiti
Abhranil Maiti
PSPatrick Schaumont
Patrick Schaumont

1 January 1999 in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Verified
Journal Article
Closed access
RPR. Pasko
R. Pasko
PSPatrick Schaumont
Patrick Schaumont
VDV. Derudder
V. Derudder
SVS. Vernalde
S. Vernalde
DDD. Durackova
D. Durackova

1 August 2009
Verified
Conference Paper
Closed access
AMAbhranil Maiti
Abhranil Maiti
PSPatrick Schaumont
Patrick Schaumont
A silicon physical unclonable function (PUF), which is a die-unique challenge-response function, is an emerging hardware primitive for secure applications. It exploits manufacturing process variations in a die to generate unique signatures out of a chip. This enables chip authentication and cryptographic key generation. A ring oscillator (RO) based PUF is a promising solution for FPGA platforms. However, the quality factors of this PUF, which include uniqueness, reliability and attack resiliency, are negatively affected by environmental noise and systematic variations in the die. This paper proposes two methods to address these negative effects, and to achieve a higher reliability in an RO-based PUF. Both methods are empirically verified on a population of five FPGAs over varying environmental conditions, and demonstrate how practically useful RO-based PUF can be achieved.

22 August 2011 in IEEE Transactions on Information Forensics and Security
Verified
Journal Article
Closed access
AMAbhranil Maiti
Abhranil Maiti
IKInyoung Kim
Inyoung Kim
PSPatrick Schaumont
Patrick Schaumont
A Physical Unclonable Function (PUF) is a promising solution to many security issues due its ability to generate a die unique identifier that can resist cloning attempts as well as physical tampering. However, the efficiency of a PUF depends on its implementation cost, its reliability, its resiliency to attacks, and the amount of entropy in it. PUF entropy is used to construct crypto graphic keys, chip identifiers, or challenge-response pairs (CRPs) in a chip authentication mechanism. The amount of entropy in a PUF is limited by the circuit resources available to build a PUF. As a result, generating longer keys or larger sets of CRPs may increase PUF circuit cost. We address this limitation in a PUF by proposing an identity-mapping function that expands the set of CRPs of a ring-oscillator PUF (RO-PUF) with low area cost. The CRPs generated through this function exhibit strong PUF qualities in terms of uniqueness and reliability. To introduce the identity-mapping function, we formulate a novel PUF system model that uncouples PUF measurement from PUF identifier formation. We show the enhanced CRP generation capability of the new function using a statistical hypothesis test. An implementation of our technique on a low-cost FPGA platform shows at least 2 times savings in area compared to the traditional RO-PUF. The proposed technique is validated using a population of 125 chips, and its reliability over varying environmental conditions is shown.