A use of the multichannel phase stepped interferometry approach to automated fringe pattern analysis in moire interferometry is described. Polarization optics is used to implement the appropriate phase shifts in each channel. The channels are created by inserting a diffraction grating at the output of the interferometer. It is possible to work at one frame rate. This system enables studies in unstable environmental conditions and studies of time dependent events.

Fresnel and Fourier holograms recorded by CCD/CMOS cameras can be numerically or optoelectronically reconstructed in order to provide visualization of 3D objects or to enable further manipulation of their phases and amplitudes. In the paper we propose to introduce into digital holographic (DH) setup Liquid Crystal on Silicon (LCOS) spatial light modulator as an active 2D optoelectronic element which facilitates performing a variety of operations at the recording and reconstruction stages. This includes introducing phase shifting digital holography, additional phase manipulation for object contouring and displacement measurements as well as for optoelectronic reconstruction of all types of digital holograms. The results of initial experiments performed with LCOS are presented and discussed. Also the future directions of development of active DH and DHI system are outlined.

Analysis of microelements requires a local approach to their mechanical behavior and material constants distribution. This requires modern full-field measurement tools, among which automated grating (moire) interferometry (GMI) is one of the best-suited measurement methods. A new type of grating microinterferometer is presented. It is based on the concept of an achromatic grating interferometer combined with a glass block waveguide and designed to work with standard optical microscopes. The various types of waveguide plates are presented and discussed. The interferogram obtained may be modified and design for analysis by means of carrier frequency phase shifting methods. The methodology of measurement is described. The usefulness of the microinterferometer is demonstrated by an example of in-plane displacement and strain distribution determination in the two-phase steel polycrystalline material. 0-

In this paper the methodology and instrumentation for the investigation of the silicon microbeam behavior under tensile and bending loads are described. The tests are performed by means of Automated Grating Interferometry (AGI) and Digital Holography (DH). Both methods deliver a direct approach to a highly sensitive measurement of surface displacements. In combination with simulation tools (analytical or FEM models) the material parameters can be determined. Consequently the main aim of the measurements is to determine the three Cartesian components of the displacement vector.