Gennady Gorokh

Dr. Gennady Gorokh

R&D Laboratory of Nanotechnologies, Belarusian State University of Informatics and Radioelectronics, Minsk, Belarus
orcid

Research Focus & Metrics

Academic Career Length

40Years (1987-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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25 September 2008 in Chemistry of Materials
Verified
Journal Article
Closed access
AMAlexander Mozalev
Alexander Mozalev
VKViacheslav Khatko
Viacheslav Khatko
CBCarla Bittencourt
Carla Bittencourt
AHAchim Walter Hassel
Achim Walter Hassel
GGGennady Gorokh
Gennady Gorokh
XCXavier Correig
Xavier Correig

1 December 2006 in Electrochimica Acta
Verified
Journal Article
Closed access
GGGennady Gorokh
Gennady Gorokh
AMA. Mozalev
A. Mozalev
DSD. Solovei
D. Solovei
VKV. Khatko
V. Khatko
Eduard LlobetEduard Llobet
Eduard Llobet
XCXavier Correig
Xavier Correig

1 August 1993 in Materials Letters
Verified
Journal Article
Closed access
VSV.F. Surganov
V.F. Surganov
GGGennady Gorokh
Gennady Gorokh

1 June 2002 in Surface Science
Verified
Journal Article
Closed access
AKA.V. Kukhta
A.V. Kukhta
GGGennady Gorokh
Gennady Gorokh
EKE.E. Kolesnik
E.E. Kolesnik
AMA.I. Mitkovets
A.I. Mitkovets
MTM.I. Taoubi
M.I. Taoubi
AMA.M. Mozalev
A.M. Mozalev

1 October 2006 in Sensors and Actuators B: Chemical
Verified
Journal Article
Closed access
VKViacheslav Khatko
Viacheslav Khatko
GGGennady Gorokh
Gennady Gorokh
AMAlexander Mozalev
Alexander Mozalev
DSDmitry Solovei
Dmitry Solovei
Eduard LlobetEduard Llobet
Eduard Llobet
XCXavier Correig
Xavier Correig

1 January 2008 in Journal of the Electrochemical Society
Verified
Journal Article
Closed access
PDF file
VKV. Khatko
V. Khatko
AMA. Mozalev
A. Mozalev
GGGennady Gorokh
Gennady Gorokh
DSD. Solovei
D. Solovei
FGF. Guirado
F. Guirado
XCXavier Correig
Xavier Correig
Thin Al films sputtered on n-silicon wafers were anodized in two potentiodynamic steps in <mml:math display="inline"><mml:mrow><mml:mn>0.4</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi mathvariant="normal">M</mml:mi></mml:mrow></mml:math>0.4M tartaric acid at <mml:math display="inline"><mml:mrow><mml:mn>210</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi mathvariant="normal">V</mml:mi></mml:mrow></mml:math>210V and <mml:math display="inline"><mml:mrow><mml:mn>0.4</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi mathvariant="normal">M</mml:mi></mml:mrow></mml:math>0.4M malonic acid at <mml:math display="inline"><mml:mrow><mml:mn>95</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi mathvariant="normal">V</mml:mi></mml:mrow></mml:math>95V to prepare nanoporous alumina templates of type A and B, respectively. Processes at the <mml:math display="inline"><mml:mrow><mml:mi>Al</mml:mi><mml:mo>∕</mml:mo><mml:mi mathvariant="normal">n</mml:mi><mml:mtext>-</mml:mtext><mml:mi>Si</mml:mi></mml:mrow></mml:math>Al∕n-Si interface were closely examined to avoid field-assisted alumina dissolution during anodizing. <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>WO3 semiconductor layers were radio-frequency magnetron sputtered onto the as-anodized and pore-widened templates. It was revealed that the sputtered <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>WO3 layers covered the entire surface of type A templates while only partly penetrating into the widened pores of type B templates. The <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>WO3 layers crystallized at <mml:math display="inline"><mml:mrow><mml:mn>350</mml:mn><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:mrow></mml:math>350°C , with monoclinic phase of <mml:math display="inline"><mml:mrow><mml:mi>P</mml:mi><mml:msub><mml:mrow><mml:mn>2</mml:mn></mml:mrow><mml:mrow><mml:mn>1</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:mi>n</mml:mi></mml:mrow></mml:math>P21∕n symmetry and an average crystallite size of <mml:math display="inline"><mml:mrow><mml:mn>28.0</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi>nm</mml:mi></mml:mrow></mml:math>28.0nm (type A) and <mml:math display="inline"><mml:mrow><mml:mn>32.5</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi>nm</mml:mi></mml:mrow></mml:math>32.5nm (type B). Amorphous alumina in the <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>Al</mml:mi><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:mi mathvariant="normal">n</mml:mi><mml:mtext>-</mml:mtext><mml:mi>Si</mml:mi></mml:mrow></mml:math>Al2O3∕n-Si systems did not crystallize up to <mml:math display="inline"><mml:mrow><mml:mn>1200</mml:mn><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:mrow></mml:math>1200°C . The common trend for the <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:msub><mml:mi>Al</mml:mi><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:mi mathvariant="normal">n</mml:mi><mml:mtext>-</mml:mtext><mml:mi>Si</mml:mi></mml:mrow></mml:math>WO3∕Al2O3∕n-Si systems was a preferential growth of <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>WO3 nanocrystallites in the <mml:math display="inline"><mml:mrow><mml:mo>⟨</mml:mo><mml:mn>100</mml:mn><mml:mo>⟩</mml:mo></mml:mrow></mml:math>⟨100⟩ direction, the texture increasing with further pore widening. Besides, the crystal texture in the <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>WO3 layer was systematically higher on type B templates. The link between the structural features and the gas-sensing ability of the <mml:math display="inline"><mml:mrow><mml:msub><mml:mi>WO</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:msub><mml:mi>Al</mml:mi><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub><mml:mo>∕</mml:mo><mml:mi mathvariant="normal">n</mml:mi><mml:mtext>-</mml:mtext><mml:mi>Si</mml:mi></mml:mrow></mml:math>WO3∕Al2O3∕n-Si systems has been discussed.