Marco Truccato

Prof. Marco Truccato

orcid

Research Focus & Metrics

Academic Career Length

33Years (1994-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 June 2017 in European Polymer Journal
Verified
Journal Article
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NANidhi Adhlakha
Nidhi Adhlakha
KYK.L. Yadav
K.L. Yadav
MTMarco Truccato
Marco Truccato
MAManjusha
Manjusha
Piu RajakPiu Rajak
Piu Rajak
ettore vittoneettore vittone
ettore vittone

10 March 2020 in Superconductor Science and Technology
Verified
Journal Article
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PDF file
LGLaura Gozzelino
Laura Gozzelino
RGRoberto Gerbaldo
Roberto Gerbaldo
GGGianluca Ghigo
Gianluca Ghigo
Daniele TorselloDaniele Torsello
Daniele Torsello
VBValentina Bonino
Valentina Bonino
PBPetre Badica
Petre Badica

25 February 2014 in Nano Letters
Verified
Journal Article
Closed access
APAlessandro Pagliero
Alessandro Pagliero
Lorenzo MinoLorenzo Mino
Lorenzo Mino
EBElisa Borfecchia
Elisa Borfecchia
MTMarco Truccato
Marco Truccato
AAAngelo Agostino
Angelo Agostino
GMGema Martínez-Criado
Gema Martínez-Criado

24 July 2002 in Superconductor Science and Technology
Verified
Journal Article
Closed access
MTMarco Truccato
Marco Truccato
GRG Rinaudo
G Rinaudo
CMC Manfredotti
C Manfredotti
AAAngelo Agostino
Angelo Agostino
PBPaola Benzi
Paola Benzi
Paolo OliveroPaolo Olivero
Paolo Olivero

15 July 2009 in Superconductor Science and Technology
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Journal Article
Closed access
MKMohammad Mizanur Rahman Khan
Mohammad Mizanur Rahman Khan
SCS Cagliero
S Cagliero
AAAngelo Agostino
Angelo Agostino
MBM Beagum
M Beagum
CPC Plapcianu
C Plapcianu
MTMarco Truccato
Marco Truccato

20 May 2005 in Applied Physics Letters
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Journal Article
Closed access
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MTMarco Truccato
Marco Truccato
CLC. Lamberti
C. Lamberti
CPC. Prestipino
C. Prestipino
AAAngelo Agostino
Angelo Agostino
We have studied Bi-2212 microcrystals aged at ambient conditions for 40 days. Combined x-ray absorption near edge structure and x-ray fluorescence measurements with micrometer space resolution show both an increase of Cu+ with respect to Cu2+ and an enrichment in Cu vs Bi and Sr cation content near the sample edges in the b -axis direction. A parallel study on an electrically contacted sample has indirectly detected the O loss, observing both a resistivity increase and an increase in sample thickness near the edges. We conclude that the O outdiffusion along the b axis is accompanied by Cu cation migration in the same direction.