Metallic nanowires are known to break into shorter fragments due to the Rayleigh instability mechanism. This process is strongly accelerated at elevated temperatures and can completely hinder the functioning of nanowire-based devices like e.g. transparent conductive and flexible coatings. At the same time, arranged gold nanodots have important applications in electrochemical sensors. In this paper we perform a series of annealing experiments of gold and silver nanowires and nanowire junctions at fixed temperatures 473, 673, 873 and 973 K (200 °C, 400 °C, 600 °C and 700 °C) during a time period of 10 min. We show that nanowires are especially prone to fragmentation around junctions and crossing points even at comparatively low temperatures. The fragmentation process is highly temperature dependent and the junction region breaks up at a lower temperature than a single nanowire. We develop a gold parametrization for kinetic Monte Carlo simulations and demonstrate the surface diffusion origin of the nanowire junction fragmentation. We show that nanowire fragmentation starts at the junctions with high reliability and propose that aligning nanowires in a regular grid could be used as a technique for fabricating arrays of nanodots.

Strong field electron emission from a nanoscale tip can cause a temperature rise at the tip apex due to Joule heating. This becomes particularly important when the current value grows rapidly, as in the pre-breakdown (the electrostatic discharge) condition, which may occur near metal surfaces operating under high electric fields. The high temperatures introduce uncertainties in calculations of the current values when using the Fowler–Nordheim equation, since the thermionic component in such conditions cannot be neglected. In this paper, we analyze the field electron emission currents as the function of the applied electric field, given by both the conventional Fowler–Nordheim field emission and the recently developed generalized thermal field emission formalisms. We also compare the results in two limits: discrete (atomistic simulations) and continuum (finite element calculations). The discrepancies of both implementations and their effect on final results are discussed. In both approaches, the electric field, electron emission currents, and Joule heating processes are simulated concurrently and self-consistently. We show that the conventional Fowler–Nordheim equation results in significant underestimation of electron emission currents. We also show that Fowler–Nordheim plots used to estimate the field enhancement factor may lead to significant overestimation of this parameter especially in the range of relatively low electric fields.