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The concealment of the time-delay signature (TDS) of chaotic external-cavity lasers is necessary to ensure the security of optical chaos-based cryptosystems. We show that this signature can be removed simply by optically injecting an external-cavity laser with a large linewidth-enhancement factor into a second, noninjection-locked, semiconductor laser. Concealment is ensured both in the amplitude and in the phase of the optical field, satisfying a sought-after property of optical chaos-based communications. Meanwhile, enhancement of the dynamical complexity, characterized by permutation entropy, coincides with strong TDS suppression over a wide range of parameters, the area for which depends sensitively on the linewidth-enhancement factor.
Digital images and video clips collected at construction jobsites are commonly used for extracting useful information. Exploring new applications for image processing techniques within the area of construction engineering and management is a steady growing field of research. One of the initial steps for various image processing applications is automatically detecting various types of construction materials on construction images. In this paper, the authors conducted a comparison study to evaluate the performance of different machine learning techniques for detection of three common categorists of building materials: Concrete, red brick, and OSB boards. The employed classifiers in this research are: Multilayer Perceptron (MLP), Radial Basis Function (RBF), and Support Vector Machine (SVM). To achieve this goal, the feature vectors extracted from image blocks are classified to perform a comparison between the efficiency of these methods for building material detection. The results indicate that for all three types of materials, SVM outperformed the other two techniques in terms of accurately detecting the material textures in images. The results also reveals that the common material detection algorithms perform very well in cases of detecting materials with distinct color and appearance (e.g., red brick); while their performance for detecting materials with color and texture variance (e.g., concrete) as well as materials containing similar color and appearance properties with other elements of the scene (e.g., ORB boards) might be less accurate.
The process by which art paintings are produced typically involves the successive applications of preparatory and paint layers to a canvas or other support; however, there is an absence of nondestructive modalities to provide a global mapping of the stratigraphy, information that is crucial for evaluation of its authenticity and attribution, for insights into historical or artist-specific techniques, as well as for conservation. We demonstrate sparsity-based terahertz reflectometry can be applied to extract a detailed 3D mapping of the layer structure of the 17th century easel painting Madonna in Preghiera by the workshop of Giovanni Battista Salvi da Sassoferrato, in which the structure of the canvas support, the ground, imprimatura, underpainting, pictorial, and varnish layers are identified quantitatively. In addition, a hitherto unidentified restoration of the varnish has been found. Our approach unlocks the full promise of terahertz reflectometry to provide a global and detailed account of an easel painting’s stratigraphy by exploiting the sparse deconvolution, without which terahertz reflectometry in the past has only provided a meager tool for the characterization of paintings with paint-layer thicknesses smaller than 50 μm. The proposed modality can also be employed across a broad range of applications in nondestructive testing and biomedical imaging.
19 November 2015 in Journal of Infrared, Millimeter, and Terahertz Waves
As semiconductor devices become ever smaller, their behavior is more likely to be determined by quantum mechanics than by classical physics. The starting point for the analysis of most nanoscale devices is the determination of the eigenstates and eigenfunctions of the structure. We present a method to solve the time-dependent Schrödinger equation that is capable of determining the eigenenergies and eigenfunctions of arbitrary three-dimensional nanostructures. The heart of this method is a formulation of the time-dependent Schrödinger equation into the finite-difference time-domain method. No approximations are made except the finite differencing of the derivatives for implementation in a computer.