Krzysztof Chmielewski

Mr. Krzysztof Chmielewski

orcid

Research Focus & Metrics

Academic Career Length

32Years (1995-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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8 August 2017 in Optical and Quantum Electronics
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Journal Article
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ABArtur Broda
Artur Broda
AKAleksandr Kuźmicz
Aleksandr Kuźmicz
GRGrzegorz Rychlik
Grzegorz Rychlik
KCKrzysztof Chmielewski
Krzysztof Chmielewski
AWAnna Wójcik-Jedlińska
Anna Wójcik-Jedlińska
JMJan Muszalski
Jan Muszalski
We compare the heat extraction efficiency for a standard Vertical External Cavity Surface-Emitting Laser and the distributed Bragg reflector (DBR)-free structure employing a single and double diamond heat-spreaders, respectively. Both heterostructures grown by Molecular Beam Epitaxy employ two identical active regions designed for emission at 980 nm. We show that the thermal resistance has been decreased 15 times when there is no DBR and heat is extracted from both side of active region. For DBR-free laser no thermal rollover of power conversion characteristic was observed in the range of considered input powers.

21 October 2021 in Materials
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PKPaweł Kozłowski
Paweł Kozłowski
KCKrzysztof Czuba
Krzysztof Czuba
KCKrzysztof Chmielewski
Krzysztof Chmielewski
JRJacek Ratajczak
Jacek Ratajczak
JBJoanna Branas
Joanna Branas
AJAgata Jasik
Agata Jasik
Indium-based micro-bump arrays, among other things, are used for the bonding of infrared photodetectors and focal plane arrays. In this paper, several aspects of the fabrication technology of micrometer-sized indium bumps with a smooth surface morphology were investigated. The thermal evaporation of indium has been optimized to achieve ~8 μm-thick layers with a small surface roughness of Ra = 11 nm, indicating a high packing density of atoms. This ensures bump uniformity across the sample, as well as prevents oxidation inside the In columns prior to the reflow. A series of experiments to optimize indium bump fabrication technology, including a shear test of single columns, is described. A reliable, repeatable, simple, and quick approach was developed with the pre-etching of indium columns in a 10% HCl solution preceded by annealing at 120 °C in N2.

1 June 2017 in Materials Science in Semiconductor Processing
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Journal Article
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AKA. Kuźmicz
A. Kuźmicz
KCKrzysztof Chmielewski
Krzysztof Chmielewski
OSO. Serebrennikova
O. Serebrennikova
JMJan Muszalski
Jan Muszalski

1 December 2010 in Measurement Science and Technology
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Journal Article
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KCKrzysztof Chmielewski
Krzysztof Chmielewski

30 November 2021 in Materials
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Journal Article
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DPDorota Pierścińska
Dorota Pierścińska
KPKamil Pierściński
Kamil Pierściński
GSGrzegorz Sobczak
Grzegorz Sobczak
KKKatarzyna Krajewska
Katarzyna Krajewska
KCKrzysztof Chmielewski
Krzysztof Chmielewski
PGPiotr Gutowski
Piotr Gutowski
In this paper, we have examined the influence of electroplated gold thickness on the thermal and electro-optical properties of mid-IR AlInAs/InGaAs, InP QCLs. The experimental results show a significant reduction of the temperature of QCL active region (AR) with increasing gold layer thickness. For QCLs with 5.0 μm gold thickness, we observed a 50% reduction of the active region temperature. An improvement of key electro-optical parameters, that is, threshold current density and maximum emitted power for structures with thick gold, was observed. The results of micro-Raman characterization show that the electroplated gold layer introduces only moderate compressive strain in top InP cladding, which is well below the critical value for the creation of misfit dislocations.

4 December 2018
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Conference Paper
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MBMaciej Bugajski
Maciej Bugajski
DPDorota Pierścińska
Dorota Pierścińska
PGPiotr Gutowski
Piotr Gutowski
KPKamil Pierściński
Kamil Pierściński
GSGrzegorz Sobczak
Grzegorz Sobczak
AKAleksander Kuźmicz
Aleksander Kuźmicz
We report recent results of works on quantum cascade lasers at the Institute of Electron Technology. During that time we have developed technology of lasers emitting at wavelengths 9.0–9.5 μm and 4.7 μm, based on InGaAs/AlGaAs/GaAs and InAlAs/InGaAs/InP heterostructures; both lattice matched and strain compensated. The structures were grown by molecular beam epitaxy MBE and by metalorganic vapor phase epitaxy MOVPE. The InGaAs/AlGaAs/GaAs lasers were grown by MBE. For InP based lasers three types of structures were investigated; the one grown exclusively by MBE without MOVPE overgrowth, the second fabricated by hybrid approach combining MBE grown AlInAs/InGaAs active region with MOVPE grown InP top waveguide layer and the third one with both the top and the bottom InP waveguide grown by MOVPE. Regardless of the waveguide construction, the active region was grown by MBE in every case. The lasers were fabricated in double trench geometry using standard processing technology. The buried heterostructure lasers were also investigated.