Ben Hughes

Prof. Ben Hughes


Research Focus & Metrics

Academic Career Length

19Years (2008-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 January 2016 in CIRP Annals
Verified
Journal Article
Closed access
Robert SchmittRobert Schmitt
Robert Schmitt
MPM. Peterek
M. Peterek
EME. Morse
E. Morse
WKW. Knapp
W. Knapp
MGM. Galetto
M. Galetto
WEW.T. Estler
W.T. Estler

3 October 2014 in Optics Express
Verified
Journal Article
Closed access
PDF file
JDJohn Dale
John Dale
BHBen Hughes
Ben Hughes
ALAndrew J Lancaster
Andrew J Lancaster
ALAndrew J Lewis
Andrew J Lewis
ARArmin J H Reichold
Armin J H Reichold
MWMatthew S Warden
Matthew S Warden
We present an implementation of an absolute distance measurement system which uses frequency scanning interferometry (FSI). The technique, referred to as dynamic FSI, uses two frequency scanning lasers, a gas absorption cell and a reference interferometer to determine the unknown optical path length difference (OPD) of one or many measurement interferometers. The gas absorption cell is the length reference for the measurement system and is traceable to international standards through knowledge of the frequencies of its absorption features. The OPD of the measurement interferometers can vary during the measurement and the variation is measured at the sampling rate of the system (2.77 MHz in the system described here). The system is shown to measure distances from 0.2 m to 20 m with a combined relative uncertainty of 0.41 × 10−6 at the two sigma level (k = 2). It will be shown that within a scan the change in OPD of the measurement interferometer can be determined to a resolution of 40 nm.

15 March 2011 in Measurement Science and Technology
Verified
Journal Article
Closed access
BHBen Hughes
Ben Hughes
AFAlistair Forbes
Alistair Forbes
ALAndrew Lewis
Andrew Lewis
WSWenjuan Sun
Wenjuan Sun
DVDan Veal
Dan Veal
KNKarim Nasr
Karim Nasr

19 January 2015 in IEEE Photonics Technology Letters
Verified
Journal Article
Closed access
JMJuan Jose Martinez
Juan Jose Martinez
MCMichael A. Campbell
Michael A. Campbell
MWMatthew S. Warden
Matthew S. Warden
BHBen Hughes
Ben Hughes
NCN. Joseph Copner
N. Joseph Copner
ALA. J. Lewis
A. J. Lewis
Frequency scanning interferometry is a well-known technique to measure the distance to a reflecting target. However, variations in the optical path length during the finite measurement time severely limit the applicability of the method in real-world environments. By the use of a second swept source measurements become immune to these variations. The use of a second source implies a great increase in costs and complexity. In this letter, we explore the possibility of using four wave mixing for the generation of the secondary swept frequency source. This greatly reduces the increase in costs and solves the synchronization issues often encountered by dual laser systems. A prototype has been built and tested against induced variations in the optical path length, proving the ability of the technique to improve distance measurements in industrial environments.

14 June 2016 in Metrologia
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Journal Article
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Sascha EichstädtSascha Eichstädt
Sascha Eichstädt
VWV Wilkens
V Wilkens
ADA Dienstfrey
A Dienstfrey
PHP Hale
P Hale
BHBen Hughes
Ben Hughes
CJC Jarvis
C Jarvis
The measurement of quantities with time-dependent values is a common task in many areas of metrology. Although well established techniques are available for the analysis of such measurements, serious scientific challenges remain to be solved to enable their routine use in metrology. In this paper we focus on the challenge of estimating a time-dependent measurand when the relationship between the value of the measurand and the indication is modeled by a convolution. Mathematically, deconvolution is an ill-posed inverse problem, requiring regularization to stabilize the inversion in the presence of noise. We present and discuss deconvolution in three practical applications: thrust-balance, ultra-fast sampling oscilloscopes and hydrophones. Each case study takes a different approach to modeling the convolution process and regularizing its inversion. Critically, all three examples lack the assignment of an uncertainty to the influence of the regularization on the estimation accuracy. This is a grand challenge for dynamic metrology, for which to date no generic solution exists. The case studies presented here cover a wide range of time scales and prior knowledge about the measurand, and they can thus serve as starting points for future developments in metrology. The aim of this work is to present the case studies and demonstrate the challenges they pose for metrology.

19 April 2013 in Measurement Science and Technology
Verified
Journal Article
Closed access
BMBala Muralikrishnan
Bala Muralikrishnan
VLVincent Lee
Vincent Lee
CBChristopher Blackburn
Christopher Blackburn
DSDaniel Sawyer
Daniel Sawyer
SPSteve Phillips
Steve Phillips
BHBen Hughes
Ben Hughes