Characterization of Threading Dislocations in PVT-Grown AlN Substrates via x-Ray Topography and Ray Tracing Simulation

Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates

Effect of constrained growth on defect structures in microgravity grown CdZnTe boules

Synchrotron X-ray topographic image contrast variation of screw-type basal plane dislocations located at different depths below the crystal surface in 4H-SiC

Synchrotron white beam topography characterization of physical vapor transport grown AlN and ammonothermal GaN