Leonid O. Vasylechko, professor of Semiconductor electronics department at Lviv Polytechnic National University. M.Sc. degree (1982) in Chemistry, Lviv State University, Ukraine. Ph.D. degree (1991) in Inorganic Chemistry, Lviv State University. D.Sc. degree (2005) in Inorganic Chemistry, The Ivan Franko National University of Lviv. Work experience: engineer, research fellow, senior research scientist at Crystal Physics and Technology department of SRC “Carat”, Lviv, Ukraine (1982-1999). Professor, principal research fellow at Semiconductor Electronic Department, Lviv Polytechnic National University (since 1999). Research interests: Solid state chemistry, crystal chemistry of complex oxides and intemetalics; phase transitions and thermal expansion; structure-properties relationship; in-situ low- and high-temperature powder diffraction; Rietveld refinement. Member of International Centre for Diffraction Data, ICDD (since 2006). ICDD Distinguished Grantee Award for demonstrated excellence in the characterization of solid state materials and the development of high quality reference data for the Powder diffraction File (2019).
Leonid O. Vasylechko, professor of Semiconductor electronics department at Lviv Polytechnic National University. M.Sc. degree (1982) in Chemistry, Lviv State University, Ukraine. Ph.D. degree (1991) in Inorganic Chemistry, Lviv State University. D.Sc. degree (2005) in Inorganic Chemistry, The Ivan Franko National University of Lviv. Work experience: engineer, research fellow, senior research scientist at Crystal Physics and Technology department of SRC “Carat”, Lviv, Ukraine (1982-1999). Professor, principal research fellow at Semiconductor Electronic Department, Lviv Polytechnic National University (since 1999). Research interests: Solid state chemistry, crystal chemistry of complex oxides and intemetalics; phase transitions and thermal expansion; structure-properties relationship; in-situ low- and high-temperature powder diffraction; Rietveld refinement. Member of International Centre for Diffraction Data, ICDD (since 2006). ICDD Distinguished Grantee Award for demonstrated excellence in the characterization of solid state materials and the development of high quality reference data for the Powder diffraction File (2019).