Diamond, as a wide band-gap semiconductor material, has the potential to be exploited under a wide range of extreme operating conditions, including those used for radiation detectors. The radiation tolerance of a single-crystal chemical vapor deposition (scCVD) diamond detector was therefore investigated while heating the device to elevated temperatures. In this way, operation under both high-temperature and high-radiation conditions could be tested simultaneously. To selectively introduce damage in small areas of the detector material, a 5 MeV scanning proton microbeam was used as damaging radiation. The charge collection efficiency (CCE) in the damaged areas was monitored using 2 MeV protons and the ion beam induced charge (IBIC) technique, indicating that the CCE decreases with increasing temperature. This decreasing trend saturates in the temperature range of approximately 660 K, after which CCE recovery is observed. These results suggest that the radiation hardness of diamond detectors deteriorates at elevated temperatures, despite the annealing effects that are also observed. It should be noted that the diamond detector investigated herein retained its very good spectroscopic properties even at an operation temperature of 725 K (≈2% for 2 MeV protons).

A new diagnostic technique that allows to obtain absolute fluxes of fast-ion losses measured with absolutely calibrated scintillator based fast-ion loss detectors (FILD) is presented here. First absolute fluxes of fast-ion losses have been obtained in the ASDEX Upgrade tokamak. An instrument function that includes the scintillator efficiency, collimator geometry, optical transmission and camera efficiency has been constructed. The scintillator response to deuterium ions in the relevant energy range of fast-ions has been characterized using a tandem accelerator. Absolute flux of neutral beam injection (NBI) prompt losses has been obtained in magnetohydrodynamic quiescent plasmas. The temporal evolution of the heat load measured with FILD follows that measured at the FILD entrance obtained with an Infra-Red camera looking at the FILD detector head. ASCOT simulations are in good agreement with the absolute heat load of NBI prompt losses measured with FILD.

An Imaging Neutral Particle Analyzer (INPA) diagnostic has been designed for the ASDEX Upgrade (AUG) tokamak. The AUG INPA diagnostic will measure fast neutrals escaping the plasma after charge exchange reactions. The neutrals will be ionized by a 20 nm carbon foil and deflected toward a scintillator by the local magnetic field. The use of a neutral beam injector (NBI) as an active source of neutrals will provide radially resolved measurements, while the use of a scintillator as an active component will allow us to cover the whole plasma along the NBI line with unprecedented phase-space resolution (<12 keV and 8 cm) and a fast temporal response (up to 1 kHz with the high resolution acquisition system and above 100 kHz with the low resolution one), making it suitable to study localized fast-ion redistributions in phase space.

Synthetic single crystal diamond grown using the chemical vapor deposition technique constitutes an extraordinary candidate material for monitoring radiation in extreme environments. However, under certain conditions, a progressive creation of space charge regions within the crystal can lead to the deterioration of charge collection efficiency. This phenomenon is called polarization and represents one of the major drawbacks associated with using this type of device. In this study, we explore different techniques to mitigate the degradation of signal due to polarization. For this purpose, two different diamond detectors are characterized by the ion beam-induced charge technique using a nuclear microprobe, which utilizes MeV energy ions of different penetration depths to probe charge transport in the detectors. The effect of polarization is analyzed by turning off the bias applied to the detector during continuous or discontinuous irradiation, and also by alternating bias polarity. In addition, the beneficial influence of temperature for reducing the effect of polarization is also observed. Finally, the effect of illuminating the detector with light is also measured. Our experimental results indicate that heating a detector or turning off the bias, and then applying it during continuous irradiation can be used as satisfactory methods for recovering the CCE value close to that of a prepolarized state. In damaged regions, illumination with white light can be used as a standard method to suppress the strength of polarization induced by holes.

The capability of single crystal diamonds to maintain their unique electronic properties even at high temperatures is, in particular, relevant for its applications as a radiation detector. In order to explore characteristics of charge transport at high temperatures (up to 450 ^∘C), diamond was exposed to MeV energy ions, both, to induce radiation damage and to probe subsequent influence on detector’s properties. Dependence of mobility-lifetime product with temperature has been obtained for electrons and holes. For holes, mu-tau displays a linear degradation with rising temperature, while for electrons, change with temperature is less evident. Furthermore, deep trapping levels induced in the material by radiation damage, were studied through time-resolved charge signals. Detrapping time was extracted from this data. Hole trap level, with the activation energy of 0.53 ± 0.01 eV has been detected in the regions of the diamond detector previously irradiated by 5 MeV damaging proton beam, but not in the pristine regions. This indicates that the trap was formed due to defect induction during radiation damage exposure. Activation of this deep level is important for charge transport performance in diamond detectors operating at high temperatures and high radiation conditions.