Corrado De Sio

Dr. Corrado De Sio

orcid

Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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6 October 2021
Verified
Conference Paper
Closed access
Corrado De SioCorrado De Sio
Corrado De Sio
Sarah AzimiSarah Azimi
Sarah Azimi
APAndrea Portaluri
Andrea Portaluri
LSLuca Sterpone
Luca Sterpone
The interest of the space industry around soft processors is increasing. However, the advantages in terms of costs and customizability provided by soft processors are countered by the reliability issues deriving by Single Event Effects, especially Single Event Upsets. Several techniques have been proposed to tackle these issues, both at the hardware- and software levels. Software approaches rely on replicating data and computations to cope with SEUs affecting the memory where the binary code is stored. Thanks to open licenses, RISC-V solutions are steadily growing in popularity among the set of available soft processors. In this works, we present a reliability evaluation of four different benchmarks running on the RI5CY soft processor implemented on SRAM-based FPGAs. The reliability of the baseline and hardened-by-replication versions of the software benchmarks are evaluated against SEUs-induced faults both at the software and hardware architecture levels through fault injection campaigns in the microprocessor memory and configuration memory, respectively. Results assess how the adoption of the hardening-by-replication technique at the software level slightly improves reliability against software-related faults but degrades reliability against architectural faults, making it an inefficient solution when it is not combined with hardware robustness.

17 June 2021 in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Verified
Journal Article
Closed access
Sarah AzimiSarah Azimi
Sarah Azimi
Corrado De SioCorrado De Sio
Corrado De Sio
LSLuca Sterpone
Luca Sterpone
Single event transients (SETs) have become increasingly problematic for modern CMOS circuits due to the continuous scaling of feature sizes and higher operating frequencies. Especially when involving safety-critical or radiation-exposed applications, the circuits must be designed using hardening techniques. In this brief, we present a new radiation-hardened-by-design full-adder cell on 45-nm technology. The proposed design is hardened against transient errors by selective duplication of sensitive transistors based on a comprehensive radiation-sensitivity analysis. Experimental results show a 62% reduction in the SET sensitivity of the proposed design with respect to the unhardened one. Moreover, the proposed hardening technique leads to improvement in performance and power overhead and zero area overhead with respect to the state-of-the-art techniques applied to the unhardened full-adder cell.

18 December 2021 in Electronics
Verified
Journal Article
Open access
PDF file
Sarah AzimiSarah Azimi
Sarah Azimi
Corrado De SioCorrado De Sio
Corrado De Sio
DRDaniele Rizzieri
Daniele Rizzieri
LSLuca Sterpone
Luca Sterpone
The continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues. This work focuses on the development of a fault injection environment capable of analyzing the impact of errors on the functionality of an ARM Cortex-A9 microprocessor embedded within a Zynq-7000 AP-SoC, considering different fault models affecting both the system memory and register resources of the embedded processor. We developed a novel Python-based fault injection platform for the emulation of radiation-induced faults within the AP-SoC hardware resources during the execution of software applications. The fault injection approach is not intrusive, and it does not require modifying the software application under evaluation. The experimental analyses have been performed on a subset of the MiBench benchmark software suite. Fault injection results demonstrate the capability of the developed method and the possibility of evaluating various sets of fault models.

30 December 2022 in Electronics
Verified
Journal Article
Open access
PDF file
Sarah AzimiSarah Azimi
Sarah Azimi
Corrado De SioCorrado De Sio
Corrado De Sio
APAndrea Portaluri
Andrea Portaluri
DRDaniele Rizzieri
Daniele Rizzieri
EVEleonora Vacca
Eleonora Vacca
DCDavid Merodio Codinachs
David Merodio Codinachs
The continuous scaling of electronic components has led to the development of high-performance microprocessors that are suitable even for safety-critical applications where radiation-induced errors such as Single Event Effects (SEEs) can have a significant impact on the performance and reliability of the system. This work is dedicated to investigating the reliability of systems based on programmable hardware and Real-time operating Systems (RTOS) in the presence of architectural faults induced by soft errors in the configuration memory of the programmable hardware. We performed a proton radiation test campaigned at PSI radiation facility to identify the fault model affecting the configuration memory of Xilinx Zynq-7020 reconfigurable AP-Soc Device. The identified fault model in terms of SEU and MBU clusters has been used to evaluate the impact of proton-induced faults on applications running within FreeRTOS on a Microblaze soft processor. A Single Event Multiple Upset fault model resulting from a proton test is presented, focusing on characteristics such as shape, size, and frequency of observed cluster of errors. We conduct two fault injection campaigns and analyze the results to assess the effect of cluster size on system reliability. Moreover, we discuss software exceptions caused by faults that can affect the hardware structure of the soft processor.


8 January 2023 in Intelligent Systems with Applications
Verified
Journal Article
Open access
Sarah AzimiSarah Azimi
Sarah Azimi
Corrado De SioCorrado De Sio
Corrado De Sio
FCFrancesco Carlucci
Francesco Carlucci
LSLuca Sterpone
Luca Sterpone
In April 2020, by the start of isolation all around the world to counter the spread of COVID-19, an increase in violence against women and kids has been observed such that it has been named The Shadow Pandemic. To fight against this phenomenon, a Canadian foundation proposed the "Signal for Help" gesture to help people in danger to alert others of being in danger, discreetly. Soon, this gesture became famous among people all around the world, and even after COVID-19 isolation, it has been used in public places to alert them of being in danger and abused. However, the problem is that the signal works if people recognize it and know what it means. To address this challenge, we present a workflow for real-time detection of "Signal for Help" based on two lightweight CNN architectures, dedicated to hand palm detection and hand gesture classification, respectively. Moreover, due to the lack of a "Signal for Help" dataset, we create the first video dataset representing the "Signal for Help" hand gesture for detection and classification applications which includes 200 videos. While the hand-detection task is based on a pre-trained network, the classifying network is trained using the publicly available Jesture dataset, including 27 classes, and fine-tuned with the "Signal for Help" dataset through transfer learning. The proposed platform shows an accuracy of 91.25% with a video processing capability of 16 fps executed on a machine with an Intel i9-9900K@3.6 GHz CPU, 31.2 GB memory, and NVIDIA GeForce RTX 2080 Ti GPU, while it reaches 6 fps when running on Jetson Nano NVIDIA developer kit as an embedded platform. The high performance and small model size of the proposed approach ensure great suitability for resource-limited devices and embedded applications which has been confirmed by implementing the developed framework on the Jetson Nano Developer Kit. A comparison between the developed framework and the state-of-the-art hand detection and classification models shows a negligible reduction in the validation accuracy, around 3%, while the proposed model required 4 times fewer resources for implementation, and inference has a speedup of about 50% on Jetson Nano platform, which make it highly suitable for embedded systems. The developed platform as well as the created dataset are publicly available.