Hanshan Li received a B.S. degree in electronic measurement and instrumentation from Xi’an Shiyou University, Xi’an, China, in 2001, an M.S. degree in testing and measurement techniques and instruments from Xi’an Technological University, Xi’an, China, in 2004 and a Ph.D. degree in testing and measurement techniques and instruments from Northwestern Polytechnical University, Xi’an, China, in 2010. He is currently a professor with Xi’an Technological University, Xi’an, China, where he is engaged in research and development of photoelectricity detection, measurement and control technology, dynamic object test technology, image processing technology, and target damage assessment. He has also published more than 100 articles in academic journals indexed in well-reputed databases, such as Science Citation Index, and holds 20 patents and has won more than 19 science and technology progress awards.