Super-resolution three-dimensional (3D) optical microscopy has incomparable advantages over other high-resolution microscopic technologies, such as electron microscopy and atomic force microscopy, in the study of biological molecules, pathways and events in live cells and tissues. We present a novel approach of structured illumination microscopy (SIM) by using a digital micromirror device (DMD) for fringe projection and a low-coherence LED light for illumination. The lateral resolution of 90 nm and the optical sectioning depth of 120 μm were achieved. The maximum acquisition speed for 3D imaging in the optical sectioning mode was 1.6×10⁷ pixels/second, which was mainly limited by the sensitivity and speed of the CCD camera. In contrast to other SIM techniques, the DMD-based LED-illumination SIM is cost-effective, ease of multi-wavelength switchable and speckle-noise-free. The 2D super-resolution and 3D optical sectioning modalities can be easily switched and applied to either fluorescent or non-fluorescent specimens.

Harnessing linear and angular momenta of light is one of the cornerstones in modern optics and has found tremendous applications in optical circuits, particle manipulation, metrology, quantum information processing, etc. Emerging theoretical protocols and experimental explorations have created a surge of interest in light lateral momenta and forces, which are perpendicular to the light wave propagation direction. However, there is yet a lack of a comprehensive and holistic overview of transverse momenta (both linear and angular) as well as of optical lateral forces (OLFs). In this article, we first review the most recent transverse momenta including the transverse spin angular momentum, optical skyrmions, as well as lateral momenta from directional side scattering, spin–orbit interaction, and surface plasmon polaritons. Since optical forces result from the momentum exchange between light and matter, the transverse momentum consequently gives rise to intriguing OLFs, which is the second topic of this article. Additional non-trivial lateral forces that combine optics with other effects from thermodynamics, electricity, and microfluidics, are also discussed. It should be emphasized that these momenta and forces ubiquitously exist in a broad range of optical phenomena and have often been neglected due to their unpredicted underlying physics and shortage of experimental means, especially prior to the last decade.

Fourier ptychography (FP) is a promising computational imaging technique that overcomes the physical space-bandwidth product (SBP) limit of a conventional microscope by applying angular-varied illuminations. However, to date, the effective imaging numerical aperture (NA) achievable with a commercial LED board is still limited to the range of 0.3−0.7 with a 4 × /0.1NA objective due to the geometric constraint with the declined illumination intensities and attenuated signal-to-noise ratio (SNR). Thus the highest achievable half-pitch resolution is usually constrained between 500−1000 nm, which cannot meet the requirements of high-resolution biomedical imaging applications. Although it is possible to improve the resolution by using a high-NA objective lens, the FP approach is less appealing as the decrease of field-of-view (FOV) will far exceed the improvement of spatial resolution in this case. In this paper, we initially present a subwavelength resolution Fourier ptychography (SRFP) platform with a hemispherical digital condenser to provide high-angle programmable plane-wave illuminations of 0.95NA, attaining a 4 × /0.1NA objective with the final effective imaging performance of 1.05NA at a half-pitch resolution of 244 nm with the incident wavelength of 465 nm across a wide FOV of 14.60 mm², corresponding to a SBP of 245 megapixels. Our work provides an essential step of FP towards high-throughput imaging applications.

Fourier ptychographic microscopy (FPM) is a recently proposed computational imaging technique with both high-resolution and wide field of view. In current FPM imaging platforms, systematic error sources come from aberrations, light-emitting diode (LED) intensity fluctuation, parameter imperfections, and noise, all of which may severely corrupt the reconstruction results with similar artifacts. Therefore, it would be unlikely to distinguish the dominating error from these degraded reconstructions without any preknowledge. In addition, systematic error is generally a mixture of various error sources in the real situation, and it cannot be separated due to their mutual restriction and conversion. To this end, we report a system calibration procedure, termed SC-FPM, to calibrate the mixed systematic errors simultaneously from an overall perspective, based on the simulated annealing algorithm, the LED intensity correction method, the nonlinear regression process, and the adaptive step-size strategy, which involves the evaluation of an error metric at each iteration step, followed by the re-estimation of accurate parameters. The performance achieved both in simulations and experiments demonstrates that the proposed method outperforms other state-of-the-art algorithms. The reported system calibration scheme improves the robustness of FPM, relaxes the experiment conditions, and does not require any preknowledge, which makes the FPM more pragmatic.

The imaginary Poynting momentum (IPM) of light has been captivated as an unusual origin of optical forces. However, the IPM force is predicted only for dipolar magnetoelectric particles that are hardly used in optical manipulation experiments. Here, we report a whole family of high-order IPM forces for not only magnetoelectric but also generic Mie particles, assisted with their excited higher multipoles within. Such optomechanical manifestations derive from a nonlocal contribution of the IPM to the optical force, which can be remarkable even when the incident IPM is small. We observe the high-order optomechanics in a structured light beam, which, despite carrying no angular momentum, is able to set normal microparticles into continuous rotation. Our results provide unambiguous evidence of the ponderomotive nature of the IPM, expand the classification of optical forces, and open new possibilities for levitated optomechanics and micromanipulations.

A simple algorithm for blind extraction of phase shifts is proposed for generalized phase-shifting interferometry from only three interferograms. Based on the statistical property of the object wave, the algorithm calculates approximately the involved phase shifts as initial values. The extraction is further improved by an iterative method, considering the fact that the closer the phase shifts approach their real values, the more uniform the reconstructed reference wave will become. The feasibility of this algorithm is demonstrated by both simulation and experiment.