Yves Traon

Prof. Dr. Yves Traon

Interdisciplinary Centre for Security, Reliability and Trust, University of Luxembourg, 4365 Esch-sur-Alzette, Luxembourg

Research Focus & Metrics

Academic Career Length

18Years (2009-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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14 March 2020 in Empirical Software Engineering
Verified
Journal Article
Closed access
PDF file
AKAnil Koyuncu
Anil Koyuncu
KLKui Liu
Kui Liu
Tegawendé F. BissyandéTegawendé F. Bissyandé
Tegawendé F. Bissyandé
DKDongsun Kim
Dongsun Kim
JKJacques Klein
Jacques Klein
YTYves Traon
Yves Traon

6 December 2018 in IEEE Transactions on Software Engineering
Verified
Journal Article
Open access
KLKui Liu
Kui Liu
DKDongsun Kim
Dongsun Kim
Tegawendé F. BissyandéTegawendé F. Bissyandé
Tegawendé F. Bissyandé
SYShin Yoo
Shin Yoo
YTYves Traon
Yves Traon
Several static analysis tools, such as Splint or FindBugs, have been proposed to the software development community to help detect security vulnerabilities or bad programming practices. However, the adoption of these tools is hindered by their high false positive rates. If the false positive rate is too high, developers may get acclimated to violation reports from these tools, causing concrete and severe bugs being overlooked. Fortunately, some violations are actually addressed and resolved by developers. We claim that those violations that are recurrently fixed are likely to be true positives, and an automated approach can learn to repair similar unseen violations. However, there is lack of a systematic way to investigate the distributions on existing violations and fixed ones in the wild, that can provide insights into prioritizing violations for developers, and an effective way to mine code and fix patterns which can help developers easily understand the reasons of leading violations and how to fix them.

31 August 2011 in Software Quality Journal
Verified
Journal Article
Open access
PDF file
GPGilles Perrouin
Gilles Perrouin
SOSebastian Oster
Sebastian Oster
SSSagar Sen
Sagar Sen
JKJacques Klein
Jacques Klein
BBBenoit Baudry
Benoit Baudry
YTYves Traon
Yves Traon
Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability, which in turn leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large products space is hardly feasible. Hence, one possible option is to test SPLs by generating test configurations that cover all possible t feature interactions (t-wise). It dramatically reduces the number of test products while ensuring reasonable SPL coverage. In this paper, we report our experience on applying t-wise techniques for SPL with two independent toolsets developed by the authors. One focuses on generality and splits the generation problem according to strategies. The other emphasizes providing efficient generation. To evaluate the respective merits of the approaches, measures such as the number of generated test configurations and the similarity between them are provided. By applying these measures, we were able to derive useful insights for pairwise and t-wise testing of product lines.

18 December 2019 in Empirical Software Engineering
Verified
Journal Article
Open access
PDF file
TCThierry Titcheu Chekam
Thierry Titcheu Chekam
MPMike Papadakis
Mike Papadakis
Tegawendé F. BissyandéTegawendé F. Bissyandé
Tegawendé F. Bissyandé
YTYves Traon
Yves Traon
KSKoushik Sen
Koushik Sen
Mutant selection refers to the problem of choosing, among a large number of mutants, the (few) ones that should be used by the testers. In view of this, we investigate the problem of selecting the fault revealing mutants, i.e., the mutants that are killable and lead to test cases that uncover unknown program faults. We formulate two variants of this problem: the fault revealing mutant selection and the fault revealing mutant prioritization. We argue and show that these problems can be tackled through a set of ‘static’ program features and propose a machine learning approach, named FaRM, that learns to select and rank killable and fault revealing mutants. Experimental results involving 1,692 real faults show the practical benefits of our approach in both examined problems. Our results show that FaRM achieves a good trade-off between application cost and effectiveness (measured in terms of faults revealed). We also show that FaRM outperforms all the existing mutant selection methods, i.e., the random mutant sampling, the selective mutation and defect prediction (mutating the code areas pointed by defect prediction). In particular, our results show that with respect to mutant selection, our approach reveals 23% to 34% more faults than any of the baseline methods, while, with respect to mutant prioritization, it achieves higher average percentage of revealed faults with a median difference between 4% and 9% (from the random mutant orderings).

9 May 2015
Verified
Book Chapter
Open access
PDF file
LLLi Li
Li Li
ABAlexandre Bartel
Alexandre Bartel
Tegawendé F. BissyandéTegawendé F. Bissyandé
Tegawendé F. Bissyandé
JKJacques Klein
Jacques Klein
YTYves Traon
Yves Traon
Android apps are made of components which can leak information between one another using the ICC mechanism. With the growing momentum of Android, a number of research contributions have led to tools for the intra-app analysis of Android apps. Unfortunately, these state-of-the-art approaches, and the associated tools, have long left out the security flaws that arise across the boundaries of single apps, in the interaction between several apps. In this paper, we present a tool called ApkCombiner which aims at reducing an inter-app communication problem to an intra-app inter-component communication problem. In practice, ApkCombiner combines different apps into a single apk on which existing tools can indirectly perform inter-app analysis. We have evaluated ApkCombiner on a dataset of 3,000 real-world Android apps, to demonstrate its capability to support static context-aware inter-app analysis scenarios.

20 April 2024 in ACM Transactions on Software Engineering and Methodology
Verified
Journal Article
Open access
QHQiang Hu
Qiang Hu
YGYuejun Guo
Yuejun Guo
XXXiaofei Xie
Xiaofei Xie
MCMaxime Cordy
Maxime Cordy
LMLei Ma
Lei Ma
YTYves Traon
Yves Traon
This article presents a comprehensive survey on test optimization in deep neural network (DNN) testing. Here, test optimization refers to testing with low data labeling effort. We analyzed 90 papers, including 43 from the software engineering (SE) community, 32 from the machine learning (ML) community, and 15 from other communities. Our study: (i) unifies the problems as well as terminologies associated with low-labeling cost testing, (ii) compares the distinct focal points of SE and ML communities, and (iii) reveals the pitfalls in existing literature. Furthermore, we highlight the research opportunities in this domain.