Kuei-Hu Chang

Prof. Dr. Kuei-Hu Chang

R.O.C Military Academy, Kaohsiung City, Taiwan
orcid

Research Focus & Metrics

Academic Career Length

22Years (2005-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 December 2018 in Applied Soft Computing
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Journal Article
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YCYung-Chia Chang
Yung-Chia Chang
Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang
GWGuan-Jhih Wu
Guan-Jhih Wu

3 May 2009 in Journal of Intelligent Manufacturing
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Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang
CCChing-Hsue Cheng
Ching-Hsue Cheng

20 October 2010 in International Journal of Systems Science
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Journal Article
Closed access
Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang
CCChing-Hsue Cheng
Ching-Hsue Cheng
Most current risk assessment methods use the risk priority number (RPN) value to evaluate the risk of failure. However, conventional RPN methodology has been criticised as having five main shortcomings as follows: (1) the assumption that the RPN elements are equally weighted leads to over simplification; (2) the RPN scale itself has some non-intuitive statistical properties; (3) the RPN elements have many duplicate numbers; (4) the RPN is derived from only three factors mainly in terms of safety; and (5) the conventional RPN method has not considered indirect relations between components. To address the above issues, an efficient and comprehensive algorithm to evaluate the risk of failure is needed. This article proposes an innovative approach, which integrates the intuitionistic fuzzy set (IFS) and the decision-making trial and evaluation laboratory (DEMATEL) approach on risk assessment. The proposed approach resolves some of the shortcomings of the conventional RPN method. A case study, which assesses the risk of 0.15 µm DRAM etching process, is used to demonstrate the effectiveness of the proposed approach. Finally, the result of the proposed method is compared with the listing approaches of risk assessment methods.

15 March 2010 in Expert Systems with Applications
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Journal Article
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Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang
TWTa-Chun Wen
Ta-Chun Wen

1 July 2013 in Engineering Failure Analysis
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Journal Article
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Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang
YCYung-Chia Chang
Yung-Chia Chang
ITI-Tien Tsai
I-Tien Tsai

1 December 2009 in Microelectronics Reliability
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Journal Article
Closed access
Kuei-Hu ChangKuei-Hu Chang
Kuei-Hu Chang