Phosphorene, a new two-dimensional material, was investigated theoretically as a promising photocatalyst material. The structural and electronic properties of phosphorene were studied using hybrid functional based HSE approximation. The effect of the adsorbed molecules on the phosphorene surface was studied for various chemical elements, such as water molecule (H2O), hydronium ion (H3O+), hydrogen atom and ion (H/H+), hydroxide molecule (OH), and hydroxide ion (OH−). The potential application of phosphorene as a photocatalyst in vacuum was proved under different pH values. A pH of 8 was found to be the suitable value for clean phosphorene in which the flat band position was corrected for the oxidizing and reducing potentials of phosphorene, but the presence of OH− ions in a basic solution damaged the surface structure and limited the use of phosphorene in photocatalysis caused by the high content (0.25 ML and 0.5 ML) of the adsorbed OH− on the phosphorene surface. The obtained results matched the required parameters of a photocatalyst for water splitting using clean phosphorene surface in neutral solution (pH = 7).
Developing devices for optoelectronic and photonic applications-based nanomaterials has been one of the most critical challenges in the last decade. In this work, we use first-principles density functional theory combined with non-equilibrium Green's function to highlight for the first time the sensitivity of optoelectronic and photonic properties toward the exfoliation process. All the studied structures were relaxed and their relevant phonon modes confirm the high structural stability. The obtained phosphorene layers remained semiconducting with a direct band gap like the respective bulk structure with 10 layers. We also examined the effects of the thickness on the electron–hole interaction by calculating absorption energy combined with electron relaxation lifetimes. Additionally, we explore the optoelectronic properties, which can also be influenced by the exfoliation. Finally, we found that the current–voltage (I–V) characteristic shows higher sensitivity toward the bulk structure than the other 2D forms of phosphorene structures, meaning that the Schottky barrier at the interface of the bulk phosphorene is much lower than mono, and few layer phosphorene.
1 March 2022 in Materials Science in Semiconductor Processing