The current state of the art of single-photon detectors operating in the mid-infrared wavelength range is reported in this review. These devices are essential for a wide range of applications, such as mid-infrared quantum communications, sensing, and metrology, which require detectors with high detection efficiency, low dark count rates, and low dead times. The technological challenge of moving from the well-performing and commercially available near-infrared single-photon detectors to mid-infrared detection is discussed. Different approaches are explored, spanning from the stoichiometric or geometric engineering of a large variety of materials for infrared applications to the exploitation of alternative novel materials and the implementation of proper detection schemes. The three most promising solutions are described in detail: superconductive nanowires, avalanche photodiodes, and photovoltaic detectors.

The use of statistical estimation theory to boost the metrological performance of the measurement apparatus is becoming increasingly popular in a wide range of applications. Recently, such an approach has been adopted in Hong Ou Mandel interferometry, setting a new record in time delay and polarization measurement. Here, we extend these pioneering experiments in the telecom range to unlock the full potential of the information-based approach combined with a versatile spectral range, aiming for its adoption in fiber-coupled devices of up to hundreds of kilometers long as bobines or optical networks. Our measurement saturates the Cramér-Rao bound and in a long lasting experiment returns an Allan deviation of the polarization angle of 0.002 degs in 1 h of integration time.

The generation of single photons in the mid-infrared spectral region is attracting the interest of scientific and technological research, motivated by the potential improvements that many important and emerging applications, such as quantum sensing, metrology and communication, could benefit from. This review reports the progress in short and mid-infrared single photon generation, focusing on probabilistic sources based on the two non-linear processes of spontaneous parametric downconversion (SPDC) and four wave mixing (FWM). On one hand, numerical simulations of mid-infrared SPDC are described as a powerful tool to assist and guide the experimental realization, along with the implementation and engineering of novel non-linear materials. On the other hand, the advantages offered by FWM in silicon waveguides in terms of integration, miniaturization and manufacturability are presented, providing an optimal technology for integrated quantum applications.

Traditional Hong-Ou-Mandel (HOM) interferometry, insensitive to photons phase mismatch, proved to be a rugged single-photon interferometric technique. By introducing a post-beam splitter polarization-dependent delay, it is possible to recover phase-sensitive fringes, obtaining a temporal quantum eraser that maintains the ruggedness of the original HOM with enhanced sensitivity. This setup shows promising applications in biological sensing and optical metrology, where high sensitivity requirements are coupled with the necessity to keep light intensity as low as possible to avoid power-induced degradation. In this paper, we developed a highly sensitive single photon birefringence-induced delay sensor operating in the telecom range (1550 nm). By using a temporal quantum eraser based on common path Hongr-Ou-Mandel Interferometry, we were able to achieve a sensitivity of 4 as for an integration time of $2·{10}^4$ s.

We developed a high sensitivity optical sensor for circular birefringence using a heralded photon source. The sensor can be employed for chirality measurements and, being based on single photons, can be exploited for fragile biological sample or in metrological applications where the light intensity must be kept as low as possible. We found the best operational condition; then, we calibrated the sensor and tested its performance up to a very long acquisition time, obtaining excellent stability and a sub-ppm birefringence detection limit (for a 100 μm sample), thus paving the way for fundamental physics test as well.