Woojin Jeon

Prof. Dr. Woojin Jeon

Department of Advanced Materials Engineering for Information & Electronics, Kyung Hee University, Gyeonggi, Korea
orcid

Research Focus & Metrics

Academic Career Length

19Years (2008-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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10 November 2014 in Applied Physics Letters
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Journal Article
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HKHan Joon Kim
Han Joon Kim
MPMin Hyuk Park
Min Hyuk Park
YKYu Jin Kim
Yu Jin Kim
YLYoung Hwan Lee
Young Hwan Lee
Woojin JeonWoojin Jeon
Woojin Jeon
CHCheol Seong Hwang
Cheol Seong Hwang
The degradation of ferroelectric (FE) properties of atomic layer deposited Hf0.5Zr0.5O2 films with increasing thickness was mitigated by inserting 1 nm-thick Al2O3 interlayer at middle position of the thickness of the FE film. The large Pr of 10 μC/cm2, which is 11 times larger than that of single layer Hf0.5Zr0.5O2 film with equivalent thickness, was achieved from the films as thick as 40 nm. The Al2O3 interlayer could interrupt the continual growth of Hf0.5Zr0.5O2 films, and the resulting decrease of grain size prevented the formation of non-ferroelectric monoclinic phase. The Al2O3 interlayer also largely decreased the leakage current of the Hf0.5Zr0.5O2 films.

6 February 2013 in Advanced Materials
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Journal Article
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JYJung Ho Yoon
Jung Ho Yoon
JHJeong Hwan Han
Jeong Hwan Han
JJJi Sim Jung
Ji Sim Jung
Woojin JeonWoojin Jeon
Woojin Jeon
GKGun Hwan Kim
Gun Hwan Kim
CHCheol Seong Hwang
Cheol Seong Hwang

18 October 2012 in Advanced Functional Materials
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Journal Article
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GKGun Hwan Kim
Gun Hwan Kim
JLJong Ho Lee
Jong Ho Lee
YAYoungbae Ahn
Youngbae Ahn
Woojin JeonWoojin Jeon
Woojin Jeon
SSSeul Ji Song
Seul Ji Song
CHCheol Seong Hwang
Cheol Seong Hwang

17 February 2014 in Physica Status Solidi (RRL) – Rapid Research Letters
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Journal Article
Closed access
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MPMin Hyuk Park
Min Hyuk Park
HKHan Joon Kim
Han Joon Kim
YKYu Jin Kim
Yu Jin Kim
Woojin JeonWoojin Jeon
Woojin Jeon
TMTaehwan Moon
Taehwan Moon
CHCheol Seong Hwang
Cheol Seong Hwang

5 May 2015 in Scientific Reports
Verified
Journal Article
Open access
DYDa-Young Yeom
Da-Young Yeom
Woojin JeonWoojin Jeon
Woojin Jeon
NTNguyen Dien Kha Tu
Nguyen Dien Kha Tu
SYSo Young Yeo
So Young Yeo
SLSang-Soo Lee
Sang-Soo Lee
HKHeesuk Kim
Heesuk Kim
For the utilization of graphene in various energy storage and conversion applications, it must be synthesized in bulk with reliable and controllable electrical properties. Although nitrogen-doped graphene shows a high doping efficiency, its electrical properties can be easily affected by oxygen and water impurities from the environment. We here report that boron-doped graphene nanoplatelets with desirable electrical properties can be prepared by the simultaneous reduction and boron-doping of graphene oxide (GO) at a high annealing temperature. B-doped graphene nanoplatelets prepared at 1000 °C show a maximum boron concentration of 6.04 ± 1.44 at %, which is the highest value among B-doped graphenes prepared using various methods. With well-mixed GO and g-B2O3as the dopant, highly uniform doping is achieved for potentially gram-scale production. In addition, as a proof-of-concept, highly B-doped graphene nanoplatelets were used as an electrode of an electrochemical double-layer capacitor (EDLC) and showed an excellent specific capacitance value of 448 F/g in an aqueous electrolyte without additional conductive additives. We believe that B-doped graphene nanoplatelets can also be used in other applications such as electrocatalyst and nano-electronics because of their reliable and controllable electrical properties regardless of the outer environment.