Meihu Ma

Dr. Meihu Ma


Research Focus & Metrics

Academic Career Length

16Years (2011-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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9 January 2015 in Journal of Vacuum Science & Technology A
Verified
Journal Article
Closed access
DPDongqing Pan
Dongqing Pan
MMMeihu Ma
Meihu Ma
YXYuanyuan Xie
Yuanyuan Xie
TJTien Chien Jen
Tien Chien Jen
CYChris Yuan
Chris Yuan
Alumina thin film is typically studied as a model atomic layer deposition (ALD) process due to its high dielectric constant, high thermal stability, and good adhesion on various wafer surfaces. Despite extensive applications of alumina ALD in microelectronics industries, details on the physical and chemical processes are not yet well understood. ALD experiments are not able to shed adequate light on the detailed information regarding the transient ALD process. Most of current numerical approaches lack detailed surface reaction mechanisms, and their results are not well correlated with experimental observations. In this paper, the authors present a combined experimental and numerical study on the details of flow and surface reactions in alumina ALD using trimethylaluminum and water as precursors. Results obtained from experiments and simulations are compared and correlated. By experiments, growth rate on five samples under different deposition conditions is characterized. The deposition rate from numerical simulation agrees well with the experimental results. Details of precursor distributions in a full cycle of ALD are studied numerically to bridge between experimental observations and simulations. The 3D transient numerical model adopts surface reaction kinetics and mechanisms based on atomic-level studies to investigate the surface deposition process. Surface deposition is shown as a strictly self-limited process in our numerical studies. ALD is a complex strong-coupled fluid, thermal and chemical process, which is not only heavily dependent on the chemical kinetics and surface conditions but also on the flow and material distributions.

6 September 2022 in Foods
Verified
Journal Article
Open access
PDF file
GHGan Hu
Gan Hu
JZJiemin Zhang
Jiemin Zhang
QWQi Wang
Qi Wang
Meihu MaMeihu Ma
Meihu Ma
MMMeihu Ma
Meihu Ma
SLShugang LI
Shugang LI
In this study, ovalbumin (OVA) was succinylated with the addition of different levels of succinic anhydride, and the structural and functional properties of succinylated OVA (SOVA) were investigated. SDS−PAGE and FTIR spectrum confirmed the covalent attachment of the succinyl group to OVA. Thermal stability and the absolute value of zeta potential (pH 6.0) of SOVA were enhanced by 14.90% and 76.77% higher than that of the native OVA (NOVA), respectively. Circular dichroism (CD) spectra demonstrated that the succinylation decreased the α−helix and increased β−sheet content to 21.31% and 43.28%, respectively. The content of free sulfhydryl groups increased and intrinsic fluorescence spectra suggested the SOVA became more unfolded and flexible as the degree of succinylation enhanced. Furthermore, succinylation effectively enhanced the solubility and decreased the interface tension (oil−water and air−water interface) of OVA. Compared to NOVA, the emulsifying activity and stability of SOVA were increased by 1.6 times and 1.2 times, respectively, and foaming capacity and stability were enhanced by 2.7 times and 1.5 times, respectively.


1 July 2017 in Electrochimica Acta
Verified
Journal Article
Closed access
DGDongsheng Guan
Dongsheng Guan
MMMeihu Ma
Meihu Ma
DPDongqing Pan
Dongqing Pan
JLJianyang Li
Jianyang Li
XGXianfeng Gao
Xianfeng Gao
CYChris Yuan
Chris Yuan

26 August 2013 in Analytical Chemistry
Verified
Journal Article
Closed access
YWYiyi Wei
Yiyi Wei
MMMeihu Ma
Meihu Ma
TCTingting Cao
Tingting Cao
QZQing Zhang
Qing Zhang
JWJun Wu
Jun Wu
Jonathan ThompsonJonathan Thompson
Jonathan Thompson

1 January 2015 in Chemical Engineering Journal
Verified
Journal Article
Closed access
YXYuanyuan Xie
Yuanyuan Xie
MMMeihu Ma
Meihu Ma
DPDongqing Pan
Dongqing Pan
CYChris Yuan
Chris Yuan