Jinfu Chen

Prof. Jinfu Chen

School of Computer Science and Communication Engineering, Jiangsu University, Zhenjiang, China
orcid

Research Focus & Metrics

Academic Career Length

14Years (2013-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 September 2020 in Journal of Systems and Software
Verified
Journal Article
Closed access
Jinfu ChenJinfu Chen
Jinfu Chen
PKPatrick Kwaku Kudjo
Patrick Kwaku Kudjo
SMSolomon Mensah
Solomon Mensah
SBSelasie Aformaley Brown
Selasie Aformaley Brown
GAGeorge Akorfu
George Akorfu

3 July 2020 in Software: Practice and Experience
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Journal Article
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PDF file
RARichard Amankwah
Richard Amankwah
Jinfu ChenJinfu Chen
Jinfu Chen
PKPatrick Kwaku Kudjo
Patrick Kwaku Kudjo
DTDavid Peter Towey
David Peter Towey

6 February 2024 in IEEE Transactions on Reliability
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Journal Article
Closed access
Jinfu ChenJinfu Chen
Jinfu Chen
JXJiaping Xu
Jiaping Xu
CCCaihua Cai
Caihua Cai
XWXiaoli Wang
Xiaoli Wang
HCHaibo Chen
Haibo Chen
ZLZhehao Li
Zhehao Li
There is a severe class imbalance problem in defect datasets, with nondefective data dominating the distribution, making it easy to generate inaccurate software defect prediction models. Ensemble learning has been proven to be one of the best methods to solve class imbalance problem. Traditional ensemble prediction models usually ensemble the results of several base classifiers simply, and most of them only ensemble once, rarely consider the diversity of ensemble or the combination of ensemble learning and neural network. In order to explore whether the secondary ensemble of classifiers based on a diversity ensemble combined with neural network can improve the performance of defect prediction model, in this article, we propose a novel dual ensemble software defect prediction (DE-SDP) approach based on a diversity ensemble combined with neural network. In the first ensemble, we use cross-validation to build different subclassifiers, then, these subclassifiers are used to establish base ensemble classifiers with weighted average method. Through seven classification algorithms, seven base ensemble classifiers can be established. In the second ensemble, a neural network model and stacking are used to ensemble the base ensemble classifiers again. We have evaluated DE-SDP against other ensemble defect prediction methods on eight datasets of NASA MDP. The results show that our approach is superior to other ensemble approaches and effectively improves the performance of defect prediction model.

1 September 2015 in Future Generation Computer Systems
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Journal Article
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CMChengying Mao
Chengying Mao
DTDavid Peter Towey
David Peter Towey
Jinfu ChenJinfu Chen
Jinfu Chen
XXXiaoyuan Xie
Xiaoyuan Xie

30 August 2024 in Computers & Security
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Journal Article
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Jinfu ChenJinfu Chen
Jinfu Chen
HXHaodi Xie
Haodi Xie
CCCaihua Cai
Caihua Cai
LSLuo Song
Luo Song
BGBo Geng
Bo Geng
WGWuhao Guo
Wuhao Guo

7 January 2020 in Software Quality Journal
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Journal Article
Closed access
PDF file
PKPatrick Kwaku Kudjo
Patrick Kwaku Kudjo
Jinfu ChenJinfu Chen
Jinfu Chen
SMSolomon Mensah
Solomon Mensah
RARichard Amankwah
Richard Amankwah
CKChristopher Kudjo
Christopher Kudjo