Zhenwei Shi received a Ph.D. degree in mathematics from the Dalian University of Technology, Dalian, China, in 2005. He was a Post-Doctoral Researcher with the Department of Automation, Tsinghua University, Beijing, China, from 2005 to 2007. He was Visiting Scholar with the Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL, USA., from 2013 to 2014. He is currently a Professor and Dean of the Image Processing Center, School of Astronautics, Beihang University, Beijing. He has authored or co-authored over 200 scientific articles in refereed journals and proceedings, including the IEEE Transactions on Pattern Analysis and Machine Intelligence, the IEEE Transactions on Image Processing, the IEEE Transactions on Geoscience and Remote Sensing, the IEEE Geoscience and Remote Sensing Letters, the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) and the IEEE International Conference on Computer Vision (ICCV). His current research interests include remote sensing image processing and analysis, computer vision, pattern recognition, and machine learning. Dr. Shi serves as an Editor for Pattern Recognition, the ISPRS Journal of Photogrammetry and Remote Sensing, and Infrared Physics and Technology, etc. His personal website is http://levir.buaa.edu.cn/.