Bolted connections have been widely applied in engineering structures, loosening will happen when bolted connections are subjected to continuous cyclic load, and a significant rotation between the nut and the bolt can be observed. Combining deep learning with machine vision, a bolt loosening detection method based on the fifth version of You Only Look Once (YOLOv5) is proposed, and the rotation of the nut is identified to detect the bolt loosening. Two different circular markers are added to the bolt and the nut separately, and then YOLOv5 is used to identify the circular markers, and the rotation angle of the nut against the bolt is calculated according to the center coordinate of each predicted box. A bolted connection structure is adopted to illustrate the effectiveness of the method. First, 200 images containing bolts and circular markers are collected to make the dataset, which is divided into a training set, verification set and test set. Second, YOLOv5 is used to train the model; the precision rate and recall rate are respectively 99.8% and 100%. Finally, the robustness of the proposed method in different shooting environments is verified by changing the shooting distance, shooting angle and light condition. When using this method to detect the bolt loosening angle, the minimum identifiable angle is 1°, and the maximum detection error is 5.91% when the camera is tilted 45°. The experimental results show that the proposed method can detect the loosening angle of the bolted connection with high accuracy; especially, the tiny angle of bolt loosening can be identified. Even under some difficult shooting conditions, the method still works. The early stage of bolt loosening can be detected by measuring the rotation angle of the nut against the bolt.

Graphene, due to its atomic layer structure, has the highest room temperature thermal conductivity k for all known materials and many excellent thermal properties.

We report on molecular dynamics studies of phonon (lattice vibrations) transport in bilayer silicon thin films stuck together via van der Waals interactions. Results indicate that for bilayer thin films with an atomically smooth interface, the in-plane thermal conductivity of the bilayer films is the same as that of a single layer; however, the in-plane thermal conductivity of bilayer films is higher than that of single films if roughness is introduced at the interface. These observations are explained by the effects of interfacial roughness on phonon specularity parameters for transmitted and reflected phonons.