The two recombinant inbred line (RIL) populations developed by crossing Almaly × Avocet S (206 RILs) and Almaly × Anza (162 RILs) were used to detect the novel genomic regions associated with adult plant resistance (APR) and seedling or all-stage resistance (ASR) to yellow rust (YR) and leaf rust (LR). The quantitative trait loci (QTLs) were detected through multi-year phenotypic evaluations (2018–2020) and using high-throughput DArTseq genotyping technology. RILs exhibited significant genetic variation with p < 0.001, and the coefficient of variation ranged from 9.79% to 47.99% for both LR and YR in all Environments and stages of evaluations. The heritability is quite high and ranged between 0.47 and 0.98. We identified nine stable QTLs for YR APR on chromosomes 1B, 2A, 2B, 3D, and 4D and four stable QTLs for LR APR on chromosomes 2B, 3B, 4A, and 5A. Furthermore, in silico analysis revealed that the key putative candidate genes such as cytochrome P450, protein kinase-like domain superfamily, zinc-binding ribosomal protein, SANT/Myb domain, WRKY transcription factor, nucleotide sugar transporter, and NAC domain superfamily were in the QTL regions and probably involved in the regulation of host response toward pathogen infection. The stable QTLs identified in this study are useful for developing rust-resistant varieties through marker-assisted selection (MAS).

Plant omics, which includes genomics, transcriptomics, metabolomics and proteomics, has played a remarkable role in the discovery of new genes and biomolecules that can be deployed for crop improvement. In wheat, great insights have been gleaned from the utilization of diverse omics approaches for both qualitative and quantitative traits. Especially, a combination of omics approaches has led to significant advances in gene discovery and pathway investigations and in deciphering the essential components of stress responses and yields. Recently, a Wheat Omics database has been developed for wheat which could be used by scientists for further accelerating functional genomics studies. In this review, we have discussed various omics technologies and platforms that have been used in wheat to enhance the understanding of the stress biology of the crop and the molecular mechanisms underlying stress tolerance.

Introduction: Septoria blotch is a globally significant disease, which ranks second in importance after wheat rusts that causes substantial yield losses. The development of Septoria blotch resistant cultivars through molecular approaches is both economical and sustainable strategy to contain the disease.Methods: For identifying genomic regions associated with resistance to Septoria tritici blotch (STB) and Septoria nodorum blotch (SNB) in wheat, a genome-wide association study (GWAS) was conducted using a diverse panel of 191 spring and winter wheat genotypes. The panel was genotyped using DArTseq™ technology and phenotyped under natural field conditions for three cropping seasons (2019–2020, 2020–2021, and 2021–2022) and under artificially inoculated field conditions for two cropping seasons (2020–2021 and 2021–2022). Additionally, the panel was phenotyped under greenhouse conditions for STB (five mixed isolates in a single experiment) and SNB (four independent isolates and a purified toxin in five different independent experiments).Results and Discussion: GWAS identified nine marker–trait associations (MTAs), including six MTAs for different isolates under greenhouse conditions, two MTAs under natural field conditions, and one MTA under artificially inoculated field conditions. A pleiotropic MTA (100023665) was identified on chromosome 5B governing resistance against SNB isolate Pn Sn2K_USA and SNB purified toxin Pn ToxA_USA and explaining 30.73% and 46.94% of phenotypic variation, respectively. In silico analysis identified important candidate genes belonging to the leucine-rich repeat (LRR) domain superfamily, zinc finger GRF-type transcription factors, potassium transporters, nucleotide-binding site (NBS) domain superfamily, disease resistance protein, P-loop containing nucleoside triphosphate hydrolase, virus X resistance protein, and NB-ARC domains. The stable and major MTAs associated with disease resistant putative candidate genes are valuable for further validation and subsequent application in wheat septoria blotch resistance breeding.

Genomic regions governing days to heading (DH), days to maturity (DM), plant height (PH), thousand-kernel weight (TKW), and test weight (TW) were investigated in a set of 190 RILs derived from a cross between a widely cultivated wheat-variety, Kachu (DPW-621-50), and a high-zinc variety, Zinc-Shakti. The RIL population was genotyped using 909 DArTseq markers and phenotyped in three environments. The constructed genetic map had a total genetic length of 4665 cM, with an average marker density of 5.13 cM. A total of thirty-seven novel quantitative trait loci (QTL), including twelve for PH, six for DH, five for DM, eight for TKW and six for TW were identified. A set of 20 stable QTLs associated with the expression of DH, DM, PH, TKW, and TW were identified in two or more environments. Three novel pleiotropic genomic-regions harboring co-localized QTLs governing two or more traits were also identified. In silico analysis revealed that the DArTseq markers were located on important putative candidate genes such as MLO-like protein, Phytochrome, Zinc finger and RING-type, Cytochrome P450 and pentatricopeptide repeat, involved in the regulation of pollen maturity, the photoperiodic modulation of flowering-time, abiotic-stress tolerance, grain-filling duration, thousand-kernel weight, seed morphology, and plant growth and development. The identified novel QTLs, particularly stable and co-localized QTLs, will be validated to estimate their effects in different genetic backgrounds for subsequent use in marker-assisted selection (MAS).