Duane Boning is a Clarence J. LeBel Professor in the Electrical Engineering and Computer Science department at MIT. His research focus is machine learning and statistical methods for the modeling and control of variation in semiconductor and photonic manufacturing processes, devices, and circuits, with over 300 journal and conference publications on these topics. He worked at Texas Instruments from 1991 through 1992. He served as Editor in Chief of the IEEE Transactions on Semiconductor Manufacturing from 2001 to 2011, as the Associate Department Head of EECS at MIT from 2004 to 2011, and as Associate Chair of the MIT Faculty from 2019 to 2021. He is currently Faculty Co-Director for the MIT Leaders for Global Operations (LGO) Program, and Associate Director of the MIT Microsystems Technology Laboratories. Prof. Boning is a Fellow of IEEE for contributions to modeling and control in semiconductor manufacturing.