Silver incorporated zinc sulfide thin films are prepared by RF magnetron sputtering technique and the influence of silver incorporation on the structural, optical and luminescence properties is analyzed using techniques like grazing incidence X-Ray diffraction (GIXRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDS), micro-Raman spectroscopy, UV-Vis spectroscopy and laser photoluminescence spectroscopy. XRD analysis presents hexagonal wurtzite structure for the films. A reduction of crystallinity of the films is observed due to Ag incorporation. The Raman spectral analysis confirms the reduction of crystallinity and increase of strain due to the Ag incorporation. AFM analysis reveals a rough surface morphology for the undoped film and Ag incorporation makes the films uniform, dense and smooth. A blue shift of band gap energy with increase in Ag incorporation is observed due to quantum confinement effect. An absorption band (450-650 nm region) due to surface plasmon resonance of the Ag clusters present in the ZnS matrix is observed for the samples with higher Ag incorporation. The complex dielectric constant, loss factor and distribution of volume and surface energy loss of the ZnS thin films are calculated. Laser photoluminescence measurements gives an intense bluish green emission from the ZnS films and a quenching of the PL emission is observed which can be due to the metal plasmonic absorption and non-radiative energy transfer due to Ag incorporation.

BaSnO₃ thin films were deposited on quartz substrate by pulsed laser deposition technique under different background oxygen pressures and the effects of oxygen pressure on the structural, morphological and optical properties of BaSnO₃ thin films are systematically investigated using different characterization techniques. The BaSnO₃ films deposited without and with oxygen pressures are polycrystalline in nature with cubic crystalline phase. Moderate oxygen ambience favors enhanced crystallinity of the BaSnO₃ films and 0.02 mbar is found to be optimum oxygen pressure for highest crystallinity. The surface morphology of the deposited films was strongly affected by the oxygen pressure in the deposition chamber. A systematic increase of film thickness and decrease of RMS surface roughness is observed with increase in oxygen pressure. XPS analysis reveals that barium is in the + 2 oxidation state and Sn is in the + 4 oxidation state in the film deposited at optimum oxygen pressure of 0.02 mbar. The deposited BaSnO₃ films have photoluminescence emissions in the visible region and have high transmittance in the visible and infrared regions. The BaSnO₃ films deposited at oxygen ambience shows a blue shift in the optical band gap. The optimized film shows high crystallinity, high value of transmittance and wide band gap energy which indicates its suitability for optoelectronic devices.

Highly textured and transparent RF sputtered Eu 2 O 3 doped ZnO films

Silver incorporated tungsten oxide thin films are prepared by RF magnetron sputtering technique. The effect of silver incorporation in micro structure evolution, phase enhancement, band gap tuning and other optical properties are investigated using techniques such as x-ray diffraction, micro-Raman spectroscopy, atomic force microscopy, scanning electron microscopy, energy dispersive x-ray spectroscopy, and UV-Visible spectroscopy. Effect of silver addition in phase formation and band gap tuning of tungsten oxide thin films are investigated. It is found that the texturing and phase formation improves with enhancement in silver content. It is also found that as the silver incorporation enhances the thickness of the films increases at the same time the strain in the film decreases. Even without annealing the desired phase can be achieved by doping with silver. A broad band centered at the wavelength 437 nm is observed in the absorption spectra of tungsten oxide films of higher silver incorporation and this can be attributed to surface plasmon resonance of silver atoms present in the tungsten oxide matrix. The transmittance of the films is decreased with increase in silver content which can be due to increase in film thickness, enhancement of scattering, and absorption of light caused by the increase of grain size, surface roughness and porosity of films and enhanced absorption due to surface plasmon resonance of silver. It is found that silver can act as the seed for the growth of tungsten oxide grains and found that the grain size increases with silver content which in turn decreases the band gap of tungsten oxide from 3.14 eV to 2.70 eV.