Waldemar Świderski

Dr. Waldemar Świderski

Military Institute of Armament Technology, Zielonka, Poland
orcid

Research Focus & Metrics

Academic Career Length

30Years (1997-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 February 2019 in Composite Structures
Verified
Journal Article
Closed access
WŚWaldemar Świderski
Waldemar Świderski

1 March 2010 in Russian Journal of Nondestructive Testing
Verified
Journal Article
Closed access
PDF file
VVV. P. Vavilov
V. P. Vavilov
DND. A. Nesteruk
D. A. Nesteruk
VSV. V. Shiryaev
V. V. Shiryaev
AIA. I. Ivanov
A. I. Ivanov
WŚWaldemar Świderski
Waldemar Świderski
The methods of infrared (thermal) tomography are reviewed. Approaches to the dynamic thermal tomography of composite materials are described, which are based on the analysis of changes in the surface temperature with time. Most experimental illustrations refer to thermal testing of fiber reinforced plastic as the typical material used in the air- and spacecraft industry.


1 May 2010 in Acta Physica Polonica A
Verified
Journal Article
Closed access
KDKrzysztof Dragan
Krzysztof Dragan
WŚWaldemar Świderski
Waldemar Świderski

15 November 2022 in Sensors
Verified
Journal Article
Open access
PDF file
NPNorbert Pałka
Norbert Pałka
MMMarcin Maciejewski
Marcin Maciejewski
KKKamil A. Kamiński
Kamil A. Kamiński
MPMarek Piszczek
Marek Piszczek
PZPrzemysław Zagrajek
Przemysław Zagrajek
WŚWaldemar Świderski
Waldemar Świderski
We built a high-speed TDS setup with the use of electronically controlled optical sampling (ECOPS), which can measure up to 1600 terahertz pulses per second. The movement of the sample was provided by two fast-speed motorized linear stages constituting the gantry. We developed a flat-bar-based metal marker approach for the synchronization of continuous line-by-line scans. We carefully compared the performance of the terahertz reflection time-domain spectroscopy (TDS) scanner operating in a slow point-by-point and a one-hundred-times faster line-by-line imaging scheme. We analyzed images obtained for both schemes for a uniform metallic breadboard with holes, as well as a glass composite sample with defects. Although the measurement time was reduced by 100 times in terms of the line-by-line scheme, the overall performance in both schemes was almost identical in terms of the defects’ sizes, shapes and locations. The results proved that the proposed ECOPS TDS system can provide uniform and extremely fast scanning without any deterioration in image quality.

1 September 2019 in Composite Structures
Verified
Journal Article
Closed access
WŚWaldemar Świderski
Waldemar Świderski